MIL-PRF-23269G
TABLE III. Qualification inspection.
Number of
Number of
Test
Examination or test
Requirement
failures
sample units
method
paragraph
allowed 1/
to be
paragraph
inspected
Group I
115
Seal
High voltage stabilization
Group II
Visual and mechanical examination (external) 2/ 3/
4/ 115
and 3.27
1
Insulation resistance (at 125°C and 25°C)
Capacitance
Dissipation factor
Group III
Thermal shock
1
12
Quality factor (Q)
Shock, specified pulse
Vibration, high frequency
Group IV
Solderability
1
12
Terminal strength
Barometric pressure
Temperature coefficient and capacitance drift
Salt atmosphere
Group V
1
10
5
Fungus 5/
Resistance to solvents
5
Resistance to soldering heat
Moisture resistance
Group VI
1
50
Life (rated condition)
30
Life (accelerated condition)
1/
A specimen having one or more defects shall be considered as a single failure.
2/
Nondestructive tests.
3/
Marking defects are based on visual examination only and shall be charged only for illegible, incomplete, or
incorrect marking.
4/
One additional sample unit is included in each sample of 115 sample units to permit substitution for the failure
allowed in group II.
5/
Certification of fungus resistance may be substituted for testing.
9
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