MIL-PRF-23269 Capacitors, Fixed, Glass Dielectric, Established Reliability, General Specification ForThis specification covers the general requirements for established reliability, glass dielectric, fixed capacitors. Capacitors covered by this specification have failure rate levels \(FRL\) established in accordance with MIL-STD-690. These FRL are established at a 90 percent confidence level and maintained at a 10 percent producer\'s risk and are based on life tests performed with rated voltage applied at 125 Deg. C. An acceleration factor of 5:1 has been used to relate life test data obtained at 150 percent of rated voltage at 125 Deg. C to rated voltage at 125 Deg. C. A part per million \(ppm\) quality system is used for documenting and reporting the average outgoing quality of capacitors supplied to this specification. Statistical process control \(SPC\) techniques are required in manufacturing process to minimize variation in production of ER capacitors supplied to the requirements of this specification.

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MIL-PRF-23269G

3.12 Quality factor (Q). When measured as specified in 4.7.8, the Q shall be not less than the value shown on

figure 1, unless otherwise specified (see 3.1).

3.13 Shock, specified pulse. When capacitors are tested as specified in 4.7.9, there shall be no intermittent

contacts of 0.5 millisecond (ms) or greater duration, open-circuiting or short-circuiting, or evidence of arcing or

mechanical damage.

3.14 Vibration, high frequency. When capacitors are tested as specified in 4.7.10, there shall be no intermittent

contacts of 0.5 ms or greater duration, open-circuiting or short-circuiting, or evidence of mechanical damage.

3.15 Solderability. When capacitors are tested as specified in 4.7.11, the dipped portion of the terminals shall

conform to the solid-wire termination criteria of method 208 of MIL-STD-202.

3.16 Terminal strength. When capacitors are tested as specified in 4.7.12, there shall be no loosening or

rupturing of the terminals, and no damage to the terminals or seal.

3.17 Barometric pressure. When capacitors are tested as specified in 4.7.13, there shall be no evidence of

damage, arcing, or breakdown.

3.18 Temperature coefficient and capacitance drift. When measured as specified in 4.7.14, the temperature

coefficient and capacitance drift shall be as specified (see 3.1).

3.19 Salt atmosphere. When capacitors are tested as specified in 4.7.15, there shall be no harmful corrosion or

mechanical damage, and the marking shall remain legible.

NOTE: Harmful corrosion shall be construed as being any type of corrosion which in any way interferes with the

mechanical or electrical performance of the capacitor.)

FIGURE 1. Quality factor (Q) at 1 MHz.