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MIL-PRF-23269 Capacitors, Fixed, Glass Dielectric, Established Reliability, General Specification ForThis specification covers the general requirements for established reliability, glass dielectric, fixed capacitors. Capacitors covered by this specification have failure rate levels \(FRL\) established in accordance with MIL-STD-690. These FRL are established at a 90 percent confidence level and maintained at a 10 percent producer\'s risk and are based on life tests performed with rated voltage applied at 125 Deg. C. An acceleration factor of 5:1 has been used to relate life test data obtained at 150 percent of rated voltage at 125 Deg. C to rated voltage at 125 Deg. C. A part per million \(ppm\) quality system is used for documenting and reporting the average outgoing quality of capacitors supplied to this specification. Statistical process control \(SPC\) techniques are required in manufacturing process to minimize variation in production of ER capacitors supplied to the requirements of this specification.

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MIL-PRF-23269G

4.6.1.2 Production lot. A production lot shall consist of all capacitors of the same style, voltage rating, nominal

capacitance value, voltage temperature characteristic, and termination finish. Manufacture of all parts in the lot shall

have been started, processed, assembled, and tested as a group. Lot identity shall be maintained throughout the

manufacturing cycle.

4.6.1.3 Group A inspection. Group A inspection shall consist of the examinations and tests specified in table IV,

in the order shown.

4.6.1.3.1 Subgroup 1 tests. The subgroup 1 tests shall be performed on a production lot basis on 100 percent of

the product supplied under this specification. Capacitors failing the tests of subgroup 1 shall be removed from the

lot. If, during the 100 percent inspection, screening requires more than 5 percent of the capacitors to be discarded,

the entire production lot shall be rejected.

TABLE IV. Group A inspection.

Examination or test

Requirement

Test method

paragraph

Sample

Lot criteria

Subgroup 1

4.7.2

3.6

Seal

100% inspection

4.7.3

3.7

High voltage stabilization

4.7.4

3.8

Insulation resistance (at 25�C)

Capacitance

Dissipation factor

Thermal shock

(styles CYR51, CYR52, and CYR53 only)

Subgroup 2 1/

Visual and mechanical examination

4.7.1

3.4

Materials

0 failures

Physical dimensions

Design and construction (other than

physical dimensions)

Marking 2/

Workmanship

Subgroup 3 3/

0 failures

4.7.11

3.15

Solderability

1/ The manufacturer may request the deletion of the subgroup 2, visual and mechanical examination, provided an

in-line or process control system for assessing and assuring the visual and mechanical requirements are met,

can be validated and approved by the qualifying activity. Deletion of this examination does not relieve the

manufacturer from meeting these requirements.

2/ Marking defects are based on visual inspection only.

3/ The manufacturer may request the deletion of the subgroup 3 solderability test, provided an in-line or process

control system for assessing and assuring the solderability of leads can be validated and approved by the

qualifying activity. Deletion of the test does not relieve the manufacturer from meeting this test requirement.