MIL-PRF-23269G
4.7 Methods of inspection.
4.7.1 Visual and mechanical examination. Capacitors shall be examined to verify that the materials, design,
construction, physical dimensions, marking, and workmanship are in accordance with the applicable requirements
4.7.2 Seal (see 3.6). Capacitors shall be tested in accordance with 4.7.2.1 or 4.7.2.2, as specified (see 3.1).
4.7.2.1 Test I (for transparent cases). Capacitors shall be immersed in a fluorescent penetrant for six and one-
half minutes and a pressure of 20 pounds per square inch gauge (psig) shall be maintained for 3 minutes. Upon
removal from the penetrant, capacitors shall be cleaned, dried, and inspected under ultra-violet light for penetration
of the dye.
4.7.2.2 Test II (for opaque cases). Capacitors shall be subjected to a saturated steam atmosphere of 5 psig for a
period of 20 minutes to 30 minutes. Insulation resistance shall be measured as specified in 4.7.4 within 5 minutes
after removal from steam atmosphere.
4.7.3 High voltage stabilization (see 3.7). Capacitors rated at 300 volts and above shall be subjected to 1,500
volts ±30 volts dc; capacitors rated at less than 300 volts shall be subjected to 400 percent ±2 percent of the dc
rated voltage at room temperature for 50 hours +10 hours, -0 hours. During this test, capacitors shall be adequately
protected against temporary voltage surges of 10 percent or more of the test voltage. After the test, capacitors shall
show no damage, arcing, or breakdown.
4.7.4 Insulation resistance (see 3.8). Capacitors shall be tested in accordance with method 302 of MIL-STD-202.
The following details shall apply:
a.
Test potential: Shall not exceed the rated voltage (see 3.1).
b.
Points of measurement: From terminal to terminal.
4.7.5 Capacitance (see 3.9). Capacitance shall be measured in accordance with method 305 of MIL-STD-202.
The following details shall apply:
a.
Test frequency: 1 MHz ±50 kHz when the nominal capacitance is 1,000 pF or less, and 1kHz ±50 Hz, when
the nominal capacitance is greater than 1,000 pF. At the option of the manufacturer, capacitance
measurements may be made at any frequency from 1 kHz to 1 MHz and referred to measurements at
1 MHz and 1 kHz, respectively.
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b.
Limit of accuracy: Shall be ±0.2 percent of nominal capacitance value or ±0.2 pF, whichever is greater.
4.7.6 Dissipation factor (see 3.10). Dissipation factor shall be measured at a frequency of 1 kHz ±100 Hz.
Measurement accuracy shall be within ±2.0 percent of 0.0005, whichever is greater.
4.7.7 Thermal shock (see 3.11). Capacitors shall be tested in accordance with method 107 of MIL-STD-202. The
following details shall apply:
a.
Test condition letter: B
b.
Measurements before cycling: Capacitance shall be measured as specified in 4.7.5.
*
c.
Measurements and examination after cycling: Insulation resistance, capacitance, and dissipation factor
shall be measured as specified in 4.7.4, 4.7.5, and 4.7.6 respectively. Capacitors shall be visually
examined for evidence of mechanical damage.
4.7.8 Quality factor (Q) (see 3.12). Capacitors shall be tested in accordance with method 306 of MIL-STD-202.
The test frequency shall be 1 MHz ±50 kHz.
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