MIL-PRF-23269 Capacitors, Fixed, Glass Dielectric, Established Reliability, General Specification ForThis specification covers the general requirements for established reliability, glass dielectric, fixed capacitors. Capacitors covered by this specification have failure rate levels \(FRL\) established in accordance with MIL-STD-690. These FRL are established at a 90 percent confidence level and maintained at a 10 percent producer\'s risk and are based on life tests performed with rated voltage applied at 125 Deg. C. An acceleration factor of 5:1 has been used to relate life test data obtained at 150 percent of rated voltage at 125 Deg. C to rated voltage at 125 Deg. C. A part per million \(ppm\) quality system is used for documenting and reporting the average outgoing quality of capacitors supplied to this specification. Statistical process control \(SPC\) techniques are required in manufacturing process to minimize variation in production of ER capacitors supplied to the requirements of this specification.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13

MIL-PRF-23269G

3.5 Interface and physical dimension requirements. Capacitors shall meet the interface and physical dimensions

specified (see 3.1).

3.5.1 Terminals.

3.5.1.1 Lead terminals. Lead terminals shall be C, D, N, or W in accordance with MIL-STD-1276. Final finish is

the option of the manufacturer.

3.5.2 Solder dip (retinning leads). Only the manufacturer (or their authorized category B distributor) may solder

dip/retin the leads of the product supplied to this specification provided the solder dip process (see appendix A) has

been approved by the qualifying activity.

3.5.2.1 Pure tin. The use of pure tin, as an underplate or final finish, is prohibited both internally and externally.

Tin content of capacitor components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a

minimum of 3 percent lead, by mass (see 6.5).

3.5.3 Case. Each capacitor shall be enclosed in a suitable case which will protect the capacitor element against

the entry of contaminants.

3.5.4 Connections. Electrical connections shall not depend upon the terminals being clamped between a metallic

member and an insulating material other than the glass material.

3.6 Seal.

3.6.1 Test I (for transparent cases). When capacitors are tested as specified in 4.7.2.1, there shall be no

evidence of dye extending into the active element.

3.6.2 Test II (for opaque cases). When capacitors are tested as specified in 4.7.2.2, the insulation resistance

shall be not less than the value specified (see 3.1).

3.7 High voltage stabilization. When capacitors are tested as specified in 4.7.3, there shall be no evidence of

damage, arcing, or breakdown.

3.8 Insulation resistance. When measured as specified in 4.7.4, the insulation resistance shall be not less than

the value specified (see 3.1).

3.9 Capacitance. When measured as specified in 4.7.5, the capacitance shall be within the applicable tolerance

of the nominal value specified (see 3.1).

3.10 Dissipation factor. When measured as specified in 4.7.6, the dissipation factor shall not exceed the value

specified (see 3.1).

3.11 Thermal shock. When tested as specified in 4.7.7, there shall be no short-circuiting and capacitors shall

meet the following requirements:

Insulation resistance:

Shall be not less than 100,000 megohms.

Capacitance:

Shall change not more than 0.5 percent of the nominal value or 0.5 pF, whichever is

greater, from the initial value obtained when measured as specified in 4.7.5.

Dissipation factor:

Shall not exceed the value specified.

Visual examination:

There shall be no evidence of corrosion or mechanical damage.