MIL-PRF-23269 Capacitors, Fixed, Glass Dielectric, Established Reliability, General Specification ForThis specification covers the general requirements for established reliability, glass dielectric, fixed capacitors. Capacitors covered by this specification have failure rate levels \(FRL\) established in accordance with MIL-STD-690. These FRL are established at a 90 percent confidence level and maintained at a 10 percent producer\'s risk and are based on life tests performed with rated voltage applied at 125 Deg. C. An acceleration factor of 5:1 has been used to relate life test data obtained at 150 percent of rated voltage at 125 Deg. C to rated voltage at 125 Deg. C. A part per million \(ppm\) quality system is used for documenting and reporting the average outgoing quality of capacitors supplied to this specification. Statistical process control \(SPC\) techniques are required in manufacturing process to minimize variation in production of ER capacitors supplied to the requirements of this specification.

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MIL-PRF-23269G

4.7.14.1 Temperature coefficient. The temperature coefficient shall be computed as follows:

(C2 - C1 ) 106

TC =

(T2 - T1 ) C1

Where:

TC = Temperature coefficient (in parts per million per degree Celsius).

C1 = Capacitance (in pF at the middle 25�C (reference temperature)).

C2 = Capacitance (in pF at test temperature).

T1 = 25�C.

T2 = Test temperature (in degrees Celsius).

4.7.14.1.1 Continuous curve temperature coefficient. As an alternate to the measurements specified in 4.7.14, a

continuous curve of capacitance versus temperature may be produced by subjecting the capacitors to a slowly

varying temperature. The temperature shall be varied from +25�C to -55�C to +125�C to +25�C. A temperature-

sensing device shall be embedded in a dummy capacitor in a manner to assure accurate internal readings in the

sample under test. Temperature shall be varied slowly enough to produce a smooth uniform curve with no loops at

-55�C or +125�C. Other test conditions shall be as specified in 4.7.14.

4.7.14.2 Capacitance drift. Capacitance drift shall be computed by dividing the greatest single difference between

any two of the three values recorded at +25�C by the intermediate value recorded at +25�C.

4.7.15 Salt atmosphere (see 3.19). Capacitors shall be tested in accordance with method 101 of MIL-STD-202.

The following detail and exception shall apply:

Applicable salt solution: Five percent.

Test condition: B.

Examination after test: Capacitors shall be visually examined for evidence of harmful corrosion and

mechanical damage.

4.7.16 Fungus (see 3.20). Capacitors shall be tested in accordance with method 508 of MIL-STD-810. Pretest

and post-test measurements are not required. After the test, capacitors shall be visually examined for evidence of

fungus growth.

4.7.17 Resistance to solvents (see 3.21). Capacitors shall be tested in accordance with method 215 of

MIL-STD-202. The following details and exceptions shall apply:

Portion of specimen to be brushed: That portion on which marking is present.

Number of specimens to be tested: As specified in applicable inspection tables.

Permissible extent of damage: As specified in 3.21.

4.7.18 Resistance to soldering heat (see 3.22). Capacitors shall be tested in accordance with method 210 of

MIL-STD-202. The following details and exception shall apply:

Test condition letter: C.

Cooling time prior to measurement after test: 10 minutes �1 minute.

Measurements and examination after test: Insulation resistance, capacitance, and dissipation factor shall

be measured at 25�C as specified in 4.7.4, 4.7.5, and 4.7.6, respectively. Capacitors shall then be

examined for evidence of mechanical damage.