MIL-PRF-23269 Capacitors, Fixed, Glass Dielectric, Established Reliability, General Specification ForThis specification covers the general requirements for established reliability, glass dielectric, fixed capacitors. Capacitors covered by this specification have failure rate levels \(FRL\) established in accordance with MIL-STD-690. These FRL are established at a 90 percent confidence level and maintained at a 10 percent producer\'s risk and are based on life tests performed with rated voltage applied at 125 Deg. C. An acceleration factor of 5:1 has been used to relate life test data obtained at 150 percent of rated voltage at 125 Deg. C to rated voltage at 125 Deg. C. A part per million \(ppm\) quality system is used for documenting and reporting the average outgoing quality of capacitors supplied to this specification. Statistical process control \(SPC\) techniques are required in manufacturing process to minimize variation in production of ER capacitors supplied to the requirements of this specification.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13

MIL-PRF-23269G

4.6.1.3.2 Manufacturer's production inspection. If the manufacturer performs tests equal to or more stringent than

those specified in subgroup 1, table IV, as the final step of their production process, group A, subgroup 1 inspection

may be waived. Authority to waive the subgroup 1 inspections shall be granted by the qualifying activity only. The

following criteria must be complied with:

Tests conducted by the manufacturer during production shall be clearly identical to or more stringent than

that specified for subgroup 1.

Manufacturer subjects 100 percent of the product supplied under this specification to their production tests.

The parameters measured and the failure criteria shall be the same or more stringent than those specified

herein.

The lot rejection criteria is the same or more stringent than that specified herein.

Once approved, the manufacturer shall not change the test procedures or criteria without prior notification

and concurrence by the qualifying activity.

4.6.1.3.3 Rejected lots. Production lots exceeding the 5 percent PDA of group A, subgroup 1 inspection shall be

segregated from new lots that have passed inspection. Lots rejected may be offered for acceptance only if the

manufacturer 100 percent retests to the requirements of subgroup 1. Resubmitted lots shall be kept separate and

shall be clearly identified as resubmitted lots. If, during the 100 percent re-inspection to subgroup 1, the lot exceeds

3 percent defective, the lot shall be rejected and shall not be resubmitted.

4.6.1.3.4 Subgroup 2 tests.

4.6.1.3.5 Subgroup 2 tests. Subgroup 2 tests shall be performed on an inspection lot basis. A sample of 13 parts

shall be randomly selected. If one or more defects are found, the lot shall be 100 percent screened for that defect.

A new sample shall then be randomly selected. If one or more defects are found in this second sample, the lot shall

be rejected and shall not be supplied to this specification.

4.6.1.3.6 Subgroup 3 tests (solderability).

4.6.1.3.6.1 Inspection lot. An inspection lot for the purpose of subgroup 3 (solderability) testing shall consist of all

lots manufactured with the same diameter lead wire and offered for inspection within the same work week. Each

manufacturing lot shall be kept separate from every other lot. All samples belonging to a manufacturing lot shall be

identified to that lot. Means of identification is at the option of the manufacturer.

4.6.1.3.6.2 Sampling plan. Five samples shall be selected randomly from each inspection lot and subjected to the

solderability test. The manufacturer may use electrical rejects from the subgroup 1 screening tests for all or part of

the samples to be used for solderability testing. If there are one or more defects, the lot shall be considered to have

failed.

4.6.1.3.6.3 Rejected lots. In the event of one or more defects, the inspection lot shall be rejected. The

manufacturer may rework the lot as follows: Each production lot that was used to form the failed inspection lot shall

be individually submitted to the solderability test as required in 4.7.11. Production lots that pass the solderability test

are available for shipment. Production lots failing the solderability test can be reworked only if submitted to the

solder dip procedure specified in Appendix A of this specification.

4.6.1.3.6.4 Disposition of samples. The solderability test is considered a destructive test, and samples submitted

to the solderability test shall not be supplied on the contract.

4.6.1.3.6.5 PPM calculations. The manufacturer shall establish a ppm system in accordance with 3.3.2 for

accessing and calculating average outgoing quality of capacitors. A ppm rate combining insulation resistance,

capacitance, and dissipation factor, shall be assessed for lots that have passed the group A inspection. The

manufacturers ppm system shall also address rectification procedures for lots failing ppm assessment. Data from

the rectification process shall not be used to calculate ppm.