MIL-PRF-55365H
4.6.1.2.3 Subgroup 1 tests.
4.6.1.2.3.1 Exponential. Subgroup 1 tests shall be performed on a production lot basis on 100 percent of the
product supplied under this specification. Capacitors failing the tests of subgroup 1 shall be removed from the lot. If
during the 100 percent inspection, screening requires that more than 5 percent (5 percent PDA) of the capacitors be
discarded due to catastrophic or dc leakage failures, the entire lot shall be rejected. Surge current failures do not
count against the PDA.
*
TABLE VII. Group A inspection for exponential distribution.
Inspection
Requirement
Test method
Sampling procedure
paragraph
paragraph
Subgroup 1
Reflow conditioning
Thermal shock (unmounted)
100% inspection
Surge current option C (when specified in PIN)
Voltage aging 1/
Surge current options A or B (when specified in PIN)
Subgroup 2
Mechanical examination
See table IX
(physical dimensions only) 2/
Subgroup 3
Visual examination
13 samples
Materials
0 failures
Marking
Workmanship
Subgroup 4
Stability at low and high temperatures
13 samples
0 failures
Subgroup 5
Surge voltage
13 samples
0 failures
Subgroup 6
Solderability 3/
13 samples
0 failures
1/ PDA for voltage aging is 5 percent; rejects shall not be delivered on the contract or order.
2/ This can be eliminated if the manufacturer has demonstrated process control under the SPC program
(see 3.3.1), and has been approved by the qualifying activity. If the design, material, construction, or
processing of the part is changed or, there are any quality problems or failures, the qualifying activity may
require resumption of the specified testing. Deletion of testing does not relieve the manufacturer from
meeting the test requirement in case of dispute.
3/ Not applicable to gold plated termination finishes.
17
For Parts Inquires submit RFQ to Parts Hangar, Inc.
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business