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MIL-PRF-55365 Capacitor, Fixed, Electrolytic \(Tantalum\), Chip, Established Reliability, Nonestablished Reliability, And High Reliability, General Specification ForThis specification covers the general requirements for non-established reliability \(non-ER\), established reliability \(ER\), and high reliability tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current \(ac\) component is small compared to the direct current \(dc\) rated voltage and where supplemental moisture protection is available \(see 6.1\). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85??C for failure rate levels \(FRL\) ranging from: a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL?â•žs are established at a 60-percent confidence level and are maintained at a 10-percent producer?â•žs risk \(exponential distribution\). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours or 1 FIT \(FIT = failure unit = one failure per 109 device hours\) at 90-percent confidence level \(Weibull distribution\).

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MIL-PRF-55365H
1.2.1.6 Product level designator. The product level designator is identified by a single letter as shown in table III.
*
TABLE III. Product level designator.
Symbol
Product level (% per 1,000 hours)
A
non-ER
Weibull FRL (see 1.1)
B
0.1
C
0.01
D
0.001
T 2/
0.01
Exponential FRL (see 1.1) 1/
M
1.0
P
0.1
R
0.01
S
0.001
1/ Inactive for new design. Use B, C, or D Weibull FRLs.
*
2/ C weibull failure rate level with mandatory C
surge current testing, DPA and Radiographic inspection,
100% visual inspection and DCL and ESR measurements
within +3 standard deviations.
1.2.1.7 Surge current option. The optional surge current tests are described in table IV. This table reflects the
required test temperature(s) as well as whether the surge current test is to be performed before or after the Weibull
grading/voltage aging test. The surge current option is identified by a single letter.
TABLE IV. Optional surge current testing.
Weibull
Exponential
Option
Temperatures
Before Weibull grading After Weibull grading
Before voltage
After voltage
letter
(Life accelerated FR)  (Life accelerated FR)
aging
aging
(+25°C ± 5°C)
A
N/A
X
N/A
X
(-55°C -5°C, +0°C and
B
N/A
X
N/A
X
+85°C ±5°C)
(-55°C -5°C, +0°C and
C
X
N/A
X
N/A
+85°C ±5°C)
Z 1/
No surge current test
N/A
N/A
N/A
N/A
1/ Not applicable to MIL-PRF-55365/4 and MIL-PRF-55365/8. When no surge current testing is required for
MIL-PRF-55365/4 and MIL-PRF-55365/8 product, no letter is included.
1.2.1.8 Case code. For specification sheets MIL-PRF-55365/11 and higher only, the capacitor PIN contains a
single letter designator that defines the capacitor case size. This letter corresponds to the case code designation in
the characteristic tables of the appropriate specification sheets (see 3.1).
3



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