MIL-PRF-55365 Capacitor, Fixed, Electrolytic \(Tantalum\), Chip, Established Reliability, Nonestablished Reliability, And High Reliability, General Specification ForThis specification covers the general requirements for non-established reliability \(non-ER\), established reliability \(ER\), and high reliability tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current \(ac\) component is small compared to the direct current \(dc\) rated voltage and where supplemental moisture protection is available \(see 6.1\). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85??C for failure rate levels \(FRL\) ranging from: a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL?╞s are established at a 60-percent confidence level and are maintained at a 10-percent producer?╞s risk \(exponential distribution\). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours or 1 FIT \(FIT = failure unit = one failure per 109 device hours\) at 90-percent confidence level \(Weibull distribution\).

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MIL-PRF-55365H

3.6 Destructive physical analysis (T level only). When examined as specified in 4.7.3, capacitors shall meet the

requirements of MIL-STD-1580, requirement 10, paragraph 10.11 with the following exception.

a. For epoxy molded cased devices, there shall be a silver epoxy attachment joining the cathode terminal to the

silver coated tantalum slug. There shall be a minimum of 25 percent attachment.

b. For devices without epoxy molded cases (orange or blue), there shall be a silver epoxy attachment joining the

cathode end cap to the silver coated tantalum slug. There shall be a minimum of 25 percent attachment (end

of anode slug only).

3.7 Interface and physical dimension. Capacitors shall meet the interface and physical dimensions specified

(see 3.1).

3.7.1 Body structure. The body structure shall be either conformally coated or molded form (see 3.1).

3.7.2 Terminals. Terminals shall be of a solid conductor, of the dimensions specified (see 3.1), and shall be

suitably treated to facilitate soldering.

3.7.2.1 Reprocessing of terminations. The manufacturer (or his authorized category B or category C distributor)

may reprocess the terminations of the capacitors supplied to this specification, provided the termination process has

been approved by the qualifying activity.

3.7.2.2 Reprocessing option. If the manufacturer (or his authorized category B or category C distributor)

reprocesses the terminations of the capacitors as a part of normal production, or as a corrective action for

solderability failure, the following shall apply:

a. Following any reprocessing, the electrical measurements as specified in group A, subgroup 1, shall be

performed on a 200 piece sample for each 8 hours of manufacturing. If there are one or more defects, the

individual inspection lot, or lots, from which the defect originated shall be subjected to 100 percent testing of

the electrical measurements of group A, subgroup 1, and shall meet the percent defective allowable (PDA)

requirements as specified in 4.6.1.2.3.1 or 4.6.1.2.3.2.

b. PPM data following the reprocessing shall be reported every 6 months. The calculation method shall be in

accordance with EIA-554-1.

3.7.2.3 Tin plated finishes. The use of pure tin, as an underplate or final finish, is prohibited both internally and

externally. Tin content of capacitor components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed

with a minimum of 3 percent lead, by mass (see 6.10).

3.8 Voltage aging (exponential only). When tested as specified in 4.7.5, capacitors shall meet the following

requirements:

As specified in 3.9.

DC leakage

Capacitance

As specified in 3.10.

Dissipation factor

As specified in 3.11.

Equivalent Series Resistance (ESR)

As specified in 3.17.

(when specified, see 3.1)

3.9 DC leakage. When measured as specified in 4.7.6, the dc leakage shall not exceed the applicable value

specified (see 3.1).

T level only: When measured as specified in 4.7.6, the dc leakage shall be within +3 standard deviations for the lot.

3.10 Capacitance. When measured as specified in 4.7.7, the capacitance shall be within the applicable tolerance

specified (see 3.1).