MIL-PRF-55365 Capacitor, Fixed, Electrolytic \(Tantalum\), Chip, Established Reliability, Nonestablished Reliability, And High Reliability, General Specification ForThis specification covers the general requirements for non-established reliability \(non-ER\), established reliability \(ER\), and high reliability tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current \(ac\) component is small compared to the direct current \(dc\) rated voltage and where supplemental moisture protection is available \(see 6.1\). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85??C for failure rate levels \(FRL\) ranging from: a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL?╞s are established at a 60-percent confidence level and are maintained at a 10-percent producer?╞s risk \(exponential distribution\). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours or 1 FIT \(FIT = failure unit = one failure per 109 device hours\) at 90-percent confidence level \(Weibull distribution\).

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MIL-PRF-55365H

4.7.17 Surge voltage (see 3.20). Capacitors shall be subjected to 1,000 cycles of the applicable surge voltage

specified in table I. The ambient temperate during cycling shall be +85�C �5�C. Each cycle shall consist of 30

seconds +2 seconds, -0 second surge voltage application followed by 30 seconds +2 seconds, -0 second discharge

period. Voltage application shall be made through a resistor of 33 ohms. The tolerance of the resistor shall be �5

percent. Each surge voltage cycle shall be performed in such a manner so that the capacitor is shorted terminal to

terminal through a copper bar, or an equivalent low resistance at the end of the 30 seconds +2 seconds, -0 second

application. An alternate method of shorting the capacitor is to discharge through the same resistance that is utilized

for charging. After the final cycle, the capacitors shall be stabilized at the inspection conditions specified in 4.3, and

the dc leakage, capacitance, dissipation factor, and ESR (when specified, see 3.1) shall be measured as specified in

4.7.18 Surge current (optional) (see 3.21). This test, when specified (see 1.2.1.7), shall be performed on a 100

percent basis either before or after Weibull/voltage aging as indicated in 4.7.18a. Capacitors shall be subjected to

three cycles at each temperature:

Option A: (+25�C �5�C; after Weibull grading or voltage aging) or

a. Temperature:

Option B: (-55�C -5�C, +0�C and +85�C �5�C; after Weibull grading or voltage aging) or

Option C: (-55�C -5�C, +0�C and +85�C �5�C; before Weibull grading or voltage aging).

Option Z or no option: No test required.

b. An individual test circuit is required for each capacitor under test.

c. Applied voltage: Rated dc voltage �2 percent from a power source having a minimum energy storage bank

of 20 times the capacitor under test across the output terminals.

d. Charge cycle: 1 second minimum.

e. Discharge cycle: 1 second minimum to a voltage below 1 percent of rated voltage.

f. The total dc resistance (excluding the capacitor) including the wiring, fixturing, and output impedance of the

regulated power supply to each test position during the charging cycle shall be a maximum of 1.0 ohm.

g. The minimum peak charge/discharge current value shall be Vr/(1.0 + ESRCAP) where ESRCAP is:

At +25 �C and +85 �C, ESRCAP = specified ESR (see 3.1).

At -55 �C, ESRCAP = 2 times specified ESR (see 3.1).

h. Capacitor failure is specified as any capacitor that draws 1 ampere after the appropriate charge

time:

Charge times vs capacitance value:

1 millisecond for capacitor values <= 330 uF.

10 milliseconds for capacitor values > 330uF and <= 3300 uF.

100 milliseconds for capacitor values > 3300uF.

After the final cycle, the dc leakage, capacitance, and dissipation factor shall be measured as specified in 4.7.6,

4.7.7, and 4.7.8, respectively.