MIL-PRF-55365 Capacitor, Fixed, Electrolytic \(Tantalum\), Chip, Established Reliability, Nonestablished Reliability, And High Reliability, General Specification ForThis specification covers the general requirements for non-established reliability \(non-ER\), established reliability \(ER\), and high reliability tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current \(ac\) component is small compared to the direct current \(dc\) rated voltage and where supplemental moisture protection is available \(see 6.1\). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85??C for failure rate levels \(FRL\) ranging from: a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL?╞s are established at a 60-percent confidence level and are maintained at a 10-percent producer?╞s risk \(exponential distribution\). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours or 1 FIT \(FIT = failure unit = one failure per 109 device hours\) at 90-percent confidence level \(Weibull distribution\).

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MIL-PRF-55365H

4.7.8 Dissipation factor (see 3.11). The dissipation factor shall be measured at a frequency of 120 Hz �5 Hz

(unless otherwise specified, see 3.1) by means of a polarized capacitance bridge. The bridge shall provide a dial

reading of 0.1 percent dissipation factor and a measuring accuracy of � (2 percent of the measured dissipation factor

plus 0.1 percent).

4.7.9 Vibration, high frequency (see 3.12). Capacitors shall be tested in accordance with

method 204 of MIL-STD-202. The following details and exceptions shall apply:

a. Mounting of specimens: Capacitors shall be mounted on a substrate as specified in 4.7.1.

b. Electrical-load conditions: During the test, the specified dc rated voltage (see 3.1) shall be applied to the

capacitors.

c. Test condition letter: D (20g).

d. Duration and direction of motion: 4 hours in each of two mutually perpendicular directions (total of 8 hours),

one parallel and the other perpendicular to the axis.

e. Measurements during vibration: During the last cycle of each plane, electrical measurements shall be made

to determine the intermittent open or short circuits. Intermittent contact and arcing shall also be determined.

Detecting equipment shall be sufficiently sensitive to detect any interruption with a duration of 0.5 ms or

greater.

Measurements after vibration: Not applicable

g. Examination after test: Capacitors shall be visually examined for evidence of mechanical damage.

4.7.10 Reflow conditioning (see 3.13). Reflow conditioning is a screening process to help remove components

with weak internal bonds. The following details should not be used as a production assembly guideline. Capacitors

shall be conditioned as follows:

a. Mounting of specimens: None.

b. Measurements before and after conditioning: None.

c. Number of cycles: 1.

d. Peak temperature: 230�C minimum.

e. Time above 183�C: 45 seconds minimum.

f. Time at 230�C or above: 5 seconds minimum.

g. Ramp rate (183�C to peak temperature): 1�C per second to 4�C per second.

h. Examination after test: None.