MIL-PRF-55365 Capacitor, Fixed, Electrolytic \(Tantalum\), Chip, Established Reliability, Nonestablished Reliability, And High Reliability, General Specification ForThis specification covers the general requirements for non-established reliability \(non-ER\), established reliability \(ER\), and high reliability tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current \(ac\) component is small compared to the direct current \(dc\) rated voltage and where supplemental moisture protection is available \(see 6.1\). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85??C for failure rate levels \(FRL\) ranging from: a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL?╞s are established at a 60-percent confidence level and are maintained at a 10-percent producer?╞s risk \(exponential distribution\). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours or 1 FIT \(FIT = failure unit = one failure per 109 device hours\) at 90-percent confidence level \(Weibull distribution\).

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11

MIL-PRF-55365H

4.7.11 Thermal shock (unmounted) (see 3.14). Capacitors shall be tested in accordance with

method 107 of MIL-STD-202. The following details and exceptions shall apply:

a. Mounting of specimens: Not applicable.

b. Initial measurements: Not applicable.

c. Test condition letter: A (5 cycles), except that in step 3, sample units shall be tested at +125�C +3�C, -0�C.

Step 3 may be performed at +150�C +3�C, -0�C at the option of the manufacturer. Step 1 may be performed

at -65�C +0�C, -5�C at the option of the manufacturer.

d. Measurements after thermal shock: Not applicable.

e. Examination after test: Not applicable.

4.7.12 Thermal shock (mounted) (see 3.15). Capacitors shall be tested in accordance with

method 107 of MIL-STD-202. The following details and exceptions shall apply:

a. Mounting of specimens: Capacitors shall be mounted on a substrate as specified in 4.7.1.

b. Initial measurements: Capacitance (see 4.7.7).

c. Test condition letter: B, except with 10 cycles.

d. Measurements after thermal shock: DC leakage, capacitance, dissipation factor, and ESR (when specified,

see 3.1) shall be measured as specified in 4.7.6, 4.7.7, 4.7.8, and 4.7.14, respectively.

e. Examination after test: Capacitors shall be visually examined for evidence of harmful corrosion, mechanical

damage, and obliteration of marking (if applicable).

4.7.13 Resistance to soldering heat (see 3.16). Capacitors shall be tested in accordance with

method 210 of MIL-STD-202. The following details and exception shall apply:

a. Mounting of specimens: Capacitors shall be mounted on a substrate as specified in 4.7.1.

b. Measurements prior to test: DC leakage, capacitance, and dissipation factor shall be measured as specified

c. Test condition letter: J, except with only one heat cycle.

d. Measurements after test: After completion of the cleaning process and following a minimum 3-hour cooling

period, the dc leakage, capacitance, and dissipation factor shall be measured as specified in 4.7.6, 4.7.7,

and 4.7.8, respectively.

e. Examination after test: Capacitors shall be visually examined for evidence of mechanical damage.