MIL-PRF-123 Capacitors, Fixed, Ceramic Dielectric, \(Temperature Stable And General Purpose\), High Reliability, General Specification ForThis specification covers the general requirements for high reliability, general purpose \(BX and BR\) and temperature stable \(BP and BG\) ceramic dielectric fixed capacitors, leaded and nonleaded for space, missile, and other high reliability applications. Capacitors covered by this specification may be used in critical frequency determining applications, timing circuits, and other applications where absolute stability is required \(BP and BG\), and in applications where appreciable variations in capacitance with respect to temperature, voltage, frequency, and life can be tolerated \(BX and BR\). Life tests in this specification are performed at two times rated voltage at maximum rated temperature, and an assumed acceleration factor of 8:1 is used to relate life test data obtained at two times rated voltage to performance at rated voltage.

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MIL-PRF-123D

TABLE XVII. Destructive physical analysis sample size.

Minimum sample size 1/

Lot size

Group 1 2/

Group 2 3/

500

501

- 10,000

10,001

- 35,000

35,001

- 500,000

1/ No failures allowed

4.6.12 Terminal strength (see 3.16).

4.6.12.1 Terminal strength (leaded capacitors) (see 3.16). Capacitors shall be tested in accordance with method

211 of MIL-STD-202. The following details and exceptions shall apply:

a. For dual-in-line package (DIP) capacitors, bend leads to full radial (down) position before testing.

b. Test condition A:

(1) Method of holding: Capacitors shall be held by one terminal and the load shall be applied gradually to the

other terminal.

(2) Applied force: 2 �.1 kilograms.

c. Test condition C: Applicable to radial-lead and DIP units only.

d. Test condition D: Applicable to axial-lead units only.

e. Examination after test: Capacitors shall be visually examined for evidence of loosening or rupturing of the

terminals.

4.6.12.2 Terminal strength (nonleaded capacitors) (see 3.16). Capacitors shall be tested in accordance with

method 211 of MIL-STD-202. The following details and exceptions shall apply:

a. Test condition A:

(1) Capacitors shall have nail head, lead wire (.020 inch to .025 inch) (.51 mm to .64 mm) attached as shown

on figure 5, prior to pull test.

(2) Method of holding: Capacitors shall be held by one terminal and the load shall be applied gradually to the

other terminal.

(3) Applied force: See figure 5.

b. Examination after test: Capacitors shall be visually examined for evidence of loosening or rupturing of the

terminals. Breakage of lead wire or solder interface, which does not expose ceramic, shall not constitute a

failure.

4.6.12.3 Pre-encapsulation terminal strength (dual-in-line package (DIP) capacitors) (see 3.16). Capacitors shall

be tested in accordance with appendix C.