MIL-PRF-123D
4. VERIFICATION
4.1 Classification of inspections. The inspections specified herein are classified as follows:
a. Qualification inspection (see 4.4).
b. In-process inspection (see 4.5.1).
4.2 QPL system. The manufacturer shall establish and maintain a QPL system in accordance with 3.3. Evidence
of such compliance is a prerequisite for qualification and retention of qualification.
4.2.1 Purchased raw materials. The following documentation for purchased raw materials shall be retained:
a. Procurement documentation: Traceability.
b. Physical and chemical property data.
c. Performance evaluation/characterization data.
4.2.2 In-house prepared materials. The following documentation for in-house prepared materials shall be
retained:
a. Fabrication process control data.
b. Physical and chemical property data.
c. Performance evaluation/characterization data.
4.2.3 Manufacturing lot performance information. Lot performance information relating to material, process, lot
conformance, inspections, and product shall be retained by the manufacturer for 10 years from the date of the
manufacture of the parts.
4.3 Inspection conditions and reference measurements.
4.3.1 Conditions. Unless otherwise specified herein, all inspections shall be performed in accordance with the
test conditions specified in the "GENERAL REQUIREMENTS" of MIL-STD-202, except relative humidity shall not
exceed 75 percent. Accuracy of all test voltage measurements shall be within ±2.0 percent of the specified voltage.
All test temperatures above 25°C shall have a tolerance of +4°C, -0°C unless otherwise specified herein.
4.3.2 Reference measurements. When requirements are based on comparative measurements made before and
after conditioning, the reference measurement shall be considered the last measurement made at +25°C ±3°C prior
to conditioning. Unless reference measurements have been made within 30 days prior to the beginning of
conditioning, they shall be repeated.
4.3.3 Power supply. The power supply used for life testing shall have a regulation of ±2 percent or less of the
specified test voltage.
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