MIL-PRF-123 Capacitors, Fixed, Ceramic Dielectric, \(Temperature Stable And General Purpose\), High Reliability, General Specification ForThis specification covers the general requirements for high reliability, general purpose \(BX and BR\) and temperature stable \(BP and BG\) ceramic dielectric fixed capacitors, leaded and nonleaded for space, missile, and other high reliability applications. Capacitors covered by this specification may be used in critical frequency determining applications, timing circuits, and other applications where absolute stability is required \(BP and BG\), and in applications where appreciable variations in capacitance with respect to temperature, voltage, frequency, and life can be tolerated \(BX and BR\). Life tests in this specification are performed at two times rated voltage at maximum rated temperature, and an assumed acceleration factor of 8:1 is used to relate life test data obtained at two times rated voltage to performance at rated voltage.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16

MIL-PRF-123D

TABLE IV. Termination.

Leaded capacitors

Nonleaded capacitors 1/

Symbol

Termination type

Symbol

Termination type

Copper, solder coated, 60 microinches,

Silver - nickel - gold

minimum

Copper clad steel, solder coated, 60

Palladium/silver alloy

microinches, minimum

Guarded, solder coated 2/

Base metallization-barrier-solder plated

(tin/lead alloy with a minimum of 4 percent

lead) 1/

1/ Nonleaded terminations W and Y are no longer available. Termination Z is a direct replacement (see

1.2.1.6 and 6.5 for details).

2/ A guarded termination is one in which the interelectrode metallization is separated from the final finish by a

barrier or guard metal; e.g., copper or nickel, etc.

2. APPLICABLE DOCUMENTS

2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This

section does not include documents cited in other sections of this specification or recommended for additional

information or as examples. While every effort has been made to ensure the completeness of this list, document

users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this

specification, whether or not they are listed.

2.2 Government documents.

2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a

part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are

those cited in the solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

(See supplement 1 for list of associated specification sheets.)

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-202

Test Methods for Electronic and Electrical Component Parts.

MIL-STD-790

Standard Practice for Established Reliability and High Reliability Qualified Products List

(QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications.

MIL-STD-1276

Leads for Electronic Component Parts.

(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the

Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2.2 Non-Government publications. The following documents form a part of this document to the extent specified

herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.

ELECTRONIC INDUSTRIES ALLIANCE (EIA)

EIA-469

Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic

Capacitors.