MIL-PRF-123 Capacitors, Fixed, Ceramic Dielectric, \(Temperature Stable And General Purpose\), High Reliability, General Specification ForThis specification covers the general requirements for high reliability, general purpose \(BX and BR\) and temperature stable \(BP and BG\) ceramic dielectric fixed capacitors, leaded and nonleaded for space, missile, and other high reliability applications. Capacitors covered by this specification may be used in critical frequency determining applications, timing circuits, and other applications where absolute stability is required \(BP and BG\), and in applications where appreciable variations in capacitance with respect to temperature, voltage, frequency, and life can be tolerated \(BX and BR\). Life tests in this specification are performed at two times rated voltage at maximum rated temperature, and an assumed acceleration factor of 8:1 is used to relate life test data obtained at two times rated voltage to performance at rated voltage.

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MIL-PRF-123D

APPENDIX C

LEAD PULL

C.1. SCOPE

C.1.1 Scope. this appendix specifies special test procedures and methods for CKS ceramic capacitors. Details

for testing of axial and radial leaded, and two-pin dual-in-line package (DIP) capacitors prior to molding or

encapsulation is included. This appendix is a mandatory part of the specification. The information contained herein

is intended for compliance.

C.2. APPLICABLE DOCUMENTS. This section is not applicable to this appendix.

C.3. EQUIPMENT

C.3.1 Guage and test stand. The test equipment used shall be capable of performing the required tests.

C.4. TEST METHOD

C.4.1 Radial devices. Firmly clamp the body of the capacitor into the test stand. Gradually apply an ever-

increasing force to one lead at a time in the direction of the leads (see figure C-1) until the limits specified in table XV

are exceeded.

C.4.2 Axial devices. Firmly clamp one lead into the test fixture. Gradually apply an increasing force (see figure

C-1) until the limits in table XV are exceeded.

C.4.3 DIP devices.

a. Place the DIP device in the test fixture in accordance with the test equipment instructions and the test

facility's operating procedure.

b. Gradually apply an ever increasing force to the capacitor body until the limits specified in table XV are

exceeded. If the capacitor chip breaks during the test, resulting in a rupture force below the minimum

allowed, disregard the reading and perform the test on another device.

C.4.4 Minimum rupture force. Minimum rupture force shall be in accordance with table XV.

C.5. REJECTION CRITERIA

C.5.1 Defects. If one failure occurs, additional samples in accordance with table XIV shall be retested with zero

failures. If two failures occur, the lot shall be rejected.