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MIL-PRF-123 Capacitors, Fixed, Ceramic Dielectric, \(Temperature Stable And General Purpose\), High Reliability, General Specification ForThis specification covers the general requirements for high reliability, general purpose \(BX and BR\) and temperature stable \(BP and BG\) ceramic dielectric fixed capacitors, leaded and nonleaded for space, missile, and other high reliability applications. Capacitors covered by this specification may be used in critical frequency determining applications, timing circuits, and other applications where absolute stability is required \(BP and BG\), and in applications where appreciable variations in capacitance with respect to temperature, voltage, frequency, and life can be tolerated \(BX and BR\). Life tests in this specification are performed at two times rated voltage at maximum rated temperature, and an assumed acceleration factor of 8:1 is used to relate life test data obtained at two times rated voltage to performance at rated voltage.

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MIL-PRF-123D

4.6.6.3 Voltage conditioning at +85�C for nonleaded solder coated chip capacitors (see 3.10). Voltage

conditioning (see table XI) shall consist of applying twice the rated voltage to the units at +85�C for 48 hours. The

voltage conditioning circuit (see figure 4) and measurements of insulation resistance (+125�C), dielectric

withstanding voltage, insulation resistance (+25�C), capacitance, and dissipation factor shall be the same as that

described in 4.6.6.2.1.

TABLE XVI. Percent defectives allowable for subgroup 1, group A inspection.

PDA overall including voltage

Style

PDA last 48 hours during voltage

conditioning at +85�C

conditioning at +125�C 1/

CKS05

1 unit or 0.1 percent

3 percent

CKS05S

1 unit or 0.1 percent

3 percent

CKS06

1 unit or 0.2 percent

5 percent

CKS06S

1 unit or 0.2 percent

5 percent

CKS07

1 unit or 0.2 percent

5 percent

CKS26

1 unit or 0.2 percent

5 percent

CKS11

1 unit or 0.1 percent

3 percent

CKS12

1 unit or 0.1 percent

3 percent

CKS14

1 unit or 0.1 percent

3 percent

CKS15

1 unit or 0.2 percent

5 percent

CKS16

1 unit or 0.2 percent

5 percent

CKS51

1 unit or 0.1 percent

3 percent

CKS52

1 unit or 0.1 percent

3 percent

CKS53

1 unit or 0.1 percent

3 percent

CKS54

1 unit or 0.1 percent

3 percent

CKS28

1 unit or 0.1 percent

3 percent

CKS29

1 unit or 0.1 percent

3 percent

CKS22

1 unit or 0.1 percent

3 percent

CKS23

1 unit or 0.1 percent

3 percent

CKS24

1 unit or 0.1 percent

3 percent

1/ For optional voltage conditioning, the time required for meeting the PDA shall be

calculated with the T(test) PDA equation in 4.6.6.2.2.

4.6.7 Capacitance (see 3.11). Capacitors shall be tested in accordance with method 305 of MIL-STD-202. The

following detail and exception shall apply:

a. Test frequency: 1 megahertz �100 kHz when the nominal capacitance is 100 pF or less for BX and BR

characteristics, and 1,000 pF or less for BP and BG characteristics. One kHz �100 Hz when the nominal

capacitance is greater than above.

b. Voltage: A root-mean-square potential of 1.0 �0.2 volt.

4.6.8 Dissipation factor (see 3.12). The dissipation factor shall be measured with a capacitance bridge or other

suitable method at the frequency and voltage specified in 4.6.7. The inherent accuracy of the measurement shall be

�2 percent of the reading plus 0.1 percent dissipation factor (absolute) unless otherwise specified. Suitable

measurement techniques shall be used to minimize errors due to the connections between the measuring apparatus

and the capacitor.

4.6.9 Dielectric withstanding voltage (see 3.13).