MIL-PRF-123D
4.6.5 Radiographic inspection (encapsulated capacitors only). The leaded capacitors shall be radiographed in
a. Number of views: One view perpendicular to the plane of the leads for both axial and radial lead style
capacitors (see appendix D, figure D-2).
b. Inspection of films: The films shall be inspected on a back-lighted illuminator using a minimum of 10X
magnification.
c. Defects: Capacitors containing any defects as specified in 3.9 and appendix D, figure D-3, shall be rejected.
d. Summary data of inspection results: A summary of the results of radiographic inspection (number of parts
inspected, number accepted, number rejected) shall be included on the report of group A inspection furnished
with each shipment of capacitors.
e. Retention of films: Radiograph films and test reports shall be retained by the manufacturer for a minimum
period of 10 years.
4.6.6 Thermal shock and voltage conditioning (see 3.10). Capacitors shall be subjected to the tests of 4.6.6.1
4.6.6.1 Thermal shock. Capacitors shall be tested in accordance with method 107 of MIL-STD-202. The
following details shall apply:
a. Test condition A, except that in step 3, sample units shall be tested at +125°C.
b. For qualification testing: 100 cycles of thermal shock.
c. For group A testing: 20 cycles of thermal shock.
d. For group B testing: 100 cycles of thermal shock.
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4.6.6.2 Voltage conditioning (see 3.10). The intent of voltage conditioning is that all parts be exposed to a
predetermined test voltage ±5 percent, for a defined time and temperature. Voltage conditioning is done to help
eliminate infant mortality capacitors from the production lot. All parts offered for electrical testing shall be subjected
to the voltage conditioning test in 4.6.6.2.1 or optional voltage conditioning test in 4.6.6.2.2. It shall be verifiable that
all parts offered for electrical tests have been exposed to the required voltage conditioning for the required time
duration. When the optional voltage conditioning test of 4.6.6.2.2 is used, the traveler shall include the specific
accelerated voltage used and the test time. See figure 4 for a suggested test circuit. An alternate test circuit can be
used, provided the notes of figure 4 are followed.
4.6.6.2.1 Standard voltage conditioning (see 3.10). Standard voltage conditioning shall be started after
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completion of the thermal shock test. The voltage conditioning shall consist of applying twice the rated voltage to the
units at the maximum rated temperature of +125°C +4°C, -0°C for a minimum of 168 hours and a maximum of 264
hours. Voltage conditioning may be terminated at any time during the 168 to 264 hour time interval, provided that
the number of failures detected during the last 48 hours of test meets the PDA requirements specified in table XVI.
Failures shall be determined by blown fuses or hot IR failures. Voltage shall be applied and shall reach maximum
value within 2 minutes, maximum. After completion of the exposure period, the following electrical tests shall be
performed:
a. Insulation resistance (+125°C). Note: This step may be skipped if step c is done at +125°C with +25°C test
limits.
b. Dielectric withstanding voltage.
c. Insulation resistance (+25°C).
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