MIL-PRF-123 Capacitors, Fixed, Ceramic Dielectric, \(Temperature Stable And General Purpose\), High Reliability, General Specification ForThis specification covers the general requirements for high reliability, general purpose \(BX and BR\) and temperature stable \(BP and BG\) ceramic dielectric fixed capacitors, leaded and nonleaded for space, missile, and other high reliability applications. Capacitors covered by this specification may be used in critical frequency determining applications, timing circuits, and other applications where absolute stability is required \(BP and BG\), and in applications where appreciable variations in capacitance with respect to temperature, voltage, frequency, and life can be tolerated \(BX and BR\). Life tests in this specification are performed at two times rated voltage at maximum rated temperature, and an assumed acceleration factor of 8:1 is used to relate life test data obtained at two times rated voltage to performance at rated voltage.

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MIL-PRF-123D

d. Capacitance.

e. Dissipation factor.

The manufacturer has the option of performing these electrical tests in any order except insulation resistance shall

always be done after dielectric withstanding voltage. If the voltage conditioning test is performed with individual

fuses in series with each part, any part tested in a position where a fuse fails shall be tested for insulation resistance

and dielectric withstanding voltage. If the part meets the initial requirements for insulation resistance and dielectric

withstanding voltage, the part shall be rejected but shall not count against the PDA in table XVI. The manufacturer

also has the option to not test parts with fuse failures and count these toward the PDA.

NOTES:

1. The power supply shall be capable of supplying the required test voltage.

2. The current limiting device shall be a resistor and/or a fuse. The current shall be limited to no less than 30

milliamperes (mA) and no more than 10 A.

3. There shall be a voltage monitor that will trigger an alarm and shut off the test if the applied voltage drops

by more than 5 percent.

4. Fuses and resistors are optional. The value of the resistors and fuses shall be such that they do not

restrict the power supply's ability to provide the required test voltage to the device under test (�5 percent).

5. The capacitor bank shall be no less than 10 capacitors.

FIGURE 4. Voltage conditioning circuitry.

4.6.6.2.2 Optional voltage conditioning (see 3.10). The manufacturer, with approval from the qualifying activity,

may perform an optional voltage conditioning test instead of the standard voltage conditioning test of 4.6.6.2.1. All

conditions of 4.6.6.2.1 apply, with the exception of the voltage applied, the test time, and the time required for

meeting the PDA. The accelerated condition selected for the optional voltage conditioning shall be used for the

duration of the test. At no time shall a combination of standard and optional voltage conditioning be allowed on the

same samples. The minimum time duration, T(test) minimum, and the time required for meeting the PDA, T(test)

PDA, shall be calculated as follows:

1344

384

Ttest (min .)

Ttest (PDA)

(E test / Erated )

2 x Erated ≤ Etest ≤ 4 x Erated

Where:

= Applied voltage

Etest

= Rated voltage of the capacitor

Erated

Ttest (min.) = Minimum test time in hours

Ttest (PDA) = Time required for meeting the PDA