MIL-PRF-55365 Capacitor, Fixed, Electrolytic \(Tantalum\), Chip, Established Reliability, Nonestablished Reliability, And High Reliability, General Specification ForThis specification covers the general requirements for non-established reliability \(non-ER\), established reliability \(ER\), and high reliability tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current \(ac\) component is small compared to the direct current \(dc\) rated voltage and where supplemental moisture protection is available \(see 6.1\). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85??C for failure rate levels \(FRL\) ranging from: a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL?╞s are established at a 60-percent confidence level and are maintained at a 10-percent producer?╞s risk \(exponential distribution\). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours or 1 FIT \(FIT = failure unit = one failure per 109 device hours\) at 90-percent confidence level \(Weibull distribution\).

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11

MIL-PRF-55365H

4.7.19 Life (see 3.22). Capacitors shall be tested in accordance with method 108 of MIL-STD-202. The following

details and exceptions shall apply:

a. Method of mounting: As specified in 4.7.1.

b. Test temperature and tolerance:

(1) For qualification: Capacitors being subjected to the test of group V of table VI shall be at +125�C +4�C,

-0�C. Capacitors being subjected to the test of group VI of table VI shall be tested at +85�C +4�C, -0�C.

(2) For group C (2,000 hours proof): Capacitors shall be tested at +125�C +4�C, -0�C.

c. Operating conditions: A minimum of dc rated voltage (see 3.1) or a minimum of derated voltage at +125�C

(see table I), as applicable, shall be applied gradually (not to exceed 5 minutes either by a slow buildup of

the voltage or through a resistor which shall be shorted out within 5 minutes). Voltage shall be applied

continuously, except for measurement periods. The impedance of the voltage source, as seen from the

terminals of each capacitor, shall not exceed 3 ohms. Storage batteries or an electronic power supply

capable of supplying at least 1 ampere when a capacitor is shorted shall be used.

d. Test condition letter: F (2,000 hours).

e. Measurements during the exposure: DC leakage at the applicable high test temperature shall be measured

as specified in 4.7.6 at 0 hour; 240 hours +72, -24 hours; 1,000 hours +72, -24 hours; and 2,000 hours +96,

-0 hours.

Measurement after exposure: Capacitors shall be returned to the inspection conditions specified in 4.3, and

visually examined for evidence of mechanical damage; dc leakage, capacitance, and dissipation factor shall

be measured as specified in 4.7.6, 4.7.7, and 4.7.8, respectively.

4.7.19.1 Extended life (exponential only). Capacitors shall be tested as specified in 4.7.19, except that the test

temperature shall be +85�C +4�C, -0�C, and the duration of the test shall be 10,000 hours. DC leakage shall be

measured as specified in 4.7.6 at +85�C +4�C, -0�C at 0 hour; 240 hours +72, -24 hours; 1,000 hours +72, -24 hours;

2,000 hours +96, -24 hours; and every 2,000 hours +96, -24 hours thereafter until 10,000 hours +120, -0 hour have

elapsed. Final measurements shall be as specified in 4.7.19f.