MIL-PRF-55365 Capacitor, Fixed, Electrolytic \(Tantalum\), Chip, Established Reliability, Nonestablished Reliability, And High Reliability, General Specification ForThis specification covers the general requirements for non-established reliability \(non-ER\), established reliability \(ER\), and high reliability tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current \(ac\) component is small compared to the direct current \(dc\) rated voltage and where supplemental moisture protection is available \(see 6.1\). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85??C for failure rate levels \(FRL\) ranging from: a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL?╞s are established at a 60-percent confidence level and are maintained at a 10-percent producer?╞s risk \(exponential distribution\). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours or 1 FIT \(FIT = failure unit = one failure per 109 device hours\) at 90-percent confidence level \(Weibull distribution\).

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MIL-PRF-55365H

4. VERIFICATION

4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:

a. Qualification inspection (see 4.4).

b. Verification of qualification (see 4.5).

c. Conformance inspection (see 4.6).

d. Periodic group C inspection (See 4.6.1.3).

4.2 QPL system. The manufacturer shall establish and maintain a QPL system as described in 3.3. Evidence of

such compliance is a prerequisite for qualification and retention of qualification.

4.3 Inspection conditions and methods.

4.3.1 Inspection conditions. Unless otherwise specified herein, all inspections shall be performed in accordance

with the test conditions specified in the "GENERAL REQUIREMENTS" of MIL-STD-202.

4.3.2 Methods.

4.3.2.1 AC measurements. AC measurements shall be made at the frequency specified. The magnitude of the ac

voltage shall be equal to or less than 1.0 volt root mean square (rms). The maximum dc bias voltage shall be equal

to or less than 2.2 volts.

4.3.2.2 Reference measurements. When requirements are based on comparative measurements made before

and after conditioning, the reference measurement shall be considered the last measurement made at 25�C �5�C

prior to conditioning. Unless reference measurements have been made within 30 days prior to the beginning of

conditioning, they shall be repeated.

4.3.3 Power supply. The power supply used for life testing shall have a regulation of �2 percent or less of the

rated voltage. The power supply employed for dc leakage current measurements shall be stabilized to at least �100

ppm. During measurements there must be no voltage fluctuations of sufficient amplitude to produce a variation in the

current measurement as read with any dc leakage current tester used to test capacitors.

4.4 Qualification inspection. Qualification inspection shall be performed at a laboratory acceptable to the

Government (see 6.4) on sample units produced with equipment and procedures normally used in production.

Qualification approval will be based on the successful completion of the tests specified in table VI, and will not be

withheld pending completion of the extended life test of 4.4.4.1.1a.

4.4.1 Sample size. The number and style combinations of capacitors to be subjected to qualification inspection

shall be as specified in appendix A of this specification.