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MIL-PRF-49464 Capacitors, Chip, Single Layer, Fixed, Parallel Plate, Ceramic Dielectric, Established Reliability, General Specification ForThis specification covers the general requirements for ceramic plate, single layer capacitors. These capacitors are intended for stripline or microstrip applications, usually at frequencies of 1 GHz and higher. Capacitors covered by this specification have failure rate levels \(FRL\) ranging from 1.0 to 0.001 percent per 1,000 hours. These failure rate levels are established at a 90-percent confidence level and maintained at a 10-percent producer\'s risk. They are based on life tests performed at a maximum rated voltage at maximum rated temperature. An acceleration factor of 8:1 has been used to relate life test data obtained at 200 percent of rated voltage at maximum rated temperature, to rated voltage at rated temperature. Statistical Process Control \(SPC\) techniques are required in the manufacturing process to minimize variation in production of capacitors supplied to the requirements of this specification.

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MIL-PRF-49464C
4.4.3 Failures. Failures in excess of those allowed in table V shall be cause for refusal to grant qualification
approval.
4.4.4 FRL and quality level verification.
4.4.4.1 FR qualification and lot conformance FR inspection. FR qualification and lot conformance FR inspection
shall be in accordance with the general and detailed requirements of MIL-STD-690 and the following details:
a. Procedure I: Qualification at the initial FR level. Level M (1.0 percent) of FRSP-90 shall apply. Sample
units shall be subjected to the qualification inspection specified in group I, table V prior to being tested as
specified in group IV, table V (see 4.4.2).
b. Procedure II: Extension of qualification to lower FR levels. To extend qualification to the P (0.1 percent), R
(0.01 percent), and S (0.001 percent) FR levels, two or more voltages within a temperature coefficient limit
may be combined. For FR levels R and S, two or more voltage temperature characteristics may be
combined.
c. Procedure III: Maintenance of FR level qualification. Maintenance period B of FRSP-10 shall apply.
Regardless of the number of production lots produced during this period, the specified number of unit hours
shall be accumulated to maintain qualification.
4.4.4.2 Quality level verification. The contractor is responsible for establishing a quality system to verify the ppm
defect level of lots. The ppm defect level shall be based on a 6-month moving average.
TABLE V. Qualification inspection.
Number of
Number of
Test method
defectives
Inspection
Requirement paragraph
sample units to
paragraph
permitted
be inspected
Group I
Thermal shock and voltage conditioning
Insulation resistance (+125°C) 1/
67 2/
0
Capacitance 1/
Dissipation factor 1/
Insulation resistance 1/
Dielectric withstanding voltage 1/
Visual and mechanical inspection
Group II
Bond strength
6
1
Die shear strength
1
Group III
Temperature coefficient limits
18
1
Immersion
Group IV
Life
25
1
Group V
Fungus 2/
6
0
Group VI
Humidity, steady state, low voltage
12
0
1/ Performed as part of voltage conditioning.
2/ Certification of fungus resistance may be substituted for testing. If certification is given for fungus (see 3.17), only
61 samples are needed.
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