MIL-PRF-49464 Capacitors, Chip, Single Layer, Fixed, Parallel Plate, Ceramic Dielectric, Established Reliability, General Specification ForThis specification covers the general requirements for ceramic plate, single layer capacitors. These capacitors are intended for stripline or microstrip applications, usually at frequencies of 1 GHz and higher. Capacitors covered by this specification have failure rate levels \(FRL\) ranging from 1.0 to 0.001 percent per 1,000 hours. These failure rate levels are established at a 90-percent confidence level and maintained at a 10-percent producer\'s risk. They are based on life tests performed at a maximum rated voltage at maximum rated temperature. An acceleration factor of 8:1 has been used to relate life test data obtained at 200 percent of rated voltage at maximum rated temperature, to rated voltage at rated temperature. Statistical Process Control \(SPC\) techniques are required in the manufacturing process to minimize variation in production of capacitors supplied to the requirements of this specification.

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MIL-PRF-49464C

4.5 Verification of qualification. Every 6 months, the manufacturer shall provide verification of qualification to the

qualifying activity. Continuation of qualification shall be based on meeting the following requirements:

b. The capacitor design has not been modified.

c. Lot rejection for group A inspection does not exceed 10 percent or one lot, whichever is greater.

d. Periodic group B inspection.

4.6 Conformance inspection.

4.6.1 Inspection of product for delivery. Inspection of product for delivery shall consist of group A inspection.

4.6.1.1 Inspection and production lot.

4.6.1.1.1 Inspection lot. An inspection lot shall consist of all capacitors of the same voltage-temperature

characteristics, produced under essentially the same conditions and offered for inspection during a single work

month. Each inspection lot shall be kept separate from every other inspection lot. The capacitance values and

voltages produced shall be represented in the lot in approximately the ratio of production.

4.6.1.1.2 Production lot. A production lot shall consist of all capacitors of the same voltage rating, nominal

capacitance value, voltage-temperature characteristic, and termination finish. The manufacture of all parts in the

production lot shall have been started, processed, assembled, and tested as a group. Lot identity shall be maintained

throughout the manufacturing cycle.

4.6.2 Group A inspection. Group A inspection shall consist of the inspections specified in table VI in the order

shown.

4.6.2.1 Subgroup 1.

4.6.2.1.1 Sampling plan. Subgroup 1 shall be performed on a production lot basis on 100 percent of the product

supplied under this specification. Capacitors failing the tests of this subgroup shall be removed from the lot. If, during

the 100 percent inspection, screening requires that more than 8 percent of the capacitors be discarded (8 percent

defective allowable (PDA)), the entire lot shall be rejected.

4.6.2.1.2 Manufacturer's production inspection. If the manufacturer performs tests similar to those specified in

subgroup 1, table VI as the final step of their production process, group A, subgroup 1 inspection may be waived and

the data resulting from the manufacturer's production tests may be used instead. Authority to waive the subgroup 1

inspections shall be granted by the qualifying activity only. The following criteria must be complied with:

a. Tests conducted by the manufacturer during production shall be clearly identical to, or more stringent than,

that specified for subgroup 1.

b. Manufacturer subjects 100 percent of the product supplied under this specification to their production tests.

c. The parameters measured and the failure criteria shall be the same as, or more stringent than, those

specified herein.

d. The lot rejection criteria is the same as, or more stringent than, that specified herein.

e. The manufacturer shall make available all information concerning the test procedures and instrumentation

used in their production tests.

f. Once approved, the manufacturer shall not change the test procedures or criteria without prior notification of,

and concurrence by, the qualifying activity.