MIL-PRF-49464 Capacitors, Chip, Single Layer, Fixed, Parallel Plate, Ceramic Dielectric, Established Reliability, General Specification ForThis specification covers the general requirements for ceramic plate, single layer capacitors. These capacitors are intended for stripline or microstrip applications, usually at frequencies of 1 GHz and higher. Capacitors covered by this specification have failure rate levels \(FRL\) ranging from 1.0 to 0.001 percent per 1,000 hours. These failure rate levels are established at a 90-percent confidence level and maintained at a 10-percent producer\'s risk. They are based on life tests performed at a maximum rated voltage at maximum rated temperature. An acceleration factor of 8:1 has been used to relate life test data obtained at 200 percent of rated voltage at maximum rated temperature, to rated voltage at rated temperature. Statistical Process Control \(SPC\) techniques are required in the manufacturing process to minimize variation in production of capacitors supplied to the requirements of this specification.

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MIL-PRF-49464C

4.8.5 Dissipation factor (see 3.8). The dissipation factor shall be measured with a capacitance bridge or other

suitable method at the frequency and voltage as specified in 4.8.4. The capacitors shall be unmounted.

4.8.6 Insulation resistance (see 3.9). Unmounted capacitors shall be tested in accordance with method 302 of

MIL-STD-202. The following details and exceptions shall apply:

Prior to performing this test, capacitors shall be carefully cleaned to remove any contamination including fingerprints.

Care must be taken to maintain cleanliness in test chamber and while making measurements.

a. Test conditions: Rated voltage as specified (see 3.1) applied through a series resistor sufficient to limit the

charging current to a minimum of 30 mA and a maximum of 50 mA.

b. Special conditions: If a failure occurs at a relative humidity of 50 percent or higher, the insulation resistance

may be measured again at a relative humidity of less than 50 percent.

c. Points of measurement: Between the terminations.

4.8.7 Dielectric withstanding voltage (see 3.10). Unmounted capacitors shall be tested in accordance with method

301 of MIL-STD-202. The following details and exceptions shall apply:

a. Magnitude and nature of test voltage: 250 percent of dc rated voltage for 5 seconds �1 second.

b. Points of application of test voltage: Between the capacitor-element terminals.

c. Limiting value of surge current: 50 mA maximum.

d. Examination after test: Capacitors shall be examined for evidence of damage and breakdown.

4.8.8 Bond strength (see 3.11). Capacitors shall be tested as specified in method 2011 of MIL-STD-883. The

following details shall apply:

a. Capacitors shall be mounted as specified in 4.8.2.

b. Test condition D.

4.8.9 Die sheer strength (see 3.12). Capacitors shall be mounted as specified in 4.8.2 and tested as specified in

method 2019 of MIL-STD-883, except AuSn eutectic or conductive epoxy shall be used to attach the capacitor.

4.8.10 Temperature coefficient limits (see 3.13). Capacitors shall be tested as specified in 4.8.4 except that the

capacitance measurements shall be made at the steps shown in table VIII and at a sufficient number of intermediate

points between steps B and D of table VIII to establish a true characteristic curve. The capacitance value obtained in

step C of table VIII shall be considered as the reference point. Capacitors shall be kept at each temperature until a

temperature equilibrium is attained. These measurements need be performed only on capacitors having a value of

10 pF or greater. Capacitors of less than 10 pF shall be characterized as having the same temperature coefficient

limits as those of 10 pF or more manufactured in the same lot.

TABLE VIII. Temperature coefficient limit cycle.

Temperature, �C

Step

Voltage, dc

None

+25 � 2

None

-55 � 2

C (reference)

None

+25 � 2

None

+125 +4, -0