MIL-PRF-49464 Capacitors, Chip, Single Layer, Fixed, Parallel Plate, Ceramic Dielectric, Established Reliability, General Specification ForThis specification covers the general requirements for ceramic plate, single layer capacitors. These capacitors are intended for stripline or microstrip applications, usually at frequencies of 1 GHz and higher. Capacitors covered by this specification have failure rate levels \(FRL\) ranging from 1.0 to 0.001 percent per 1,000 hours. These failure rate levels are established at a 90-percent confidence level and maintained at a 10-percent producer\'s risk. They are based on life tests performed at a maximum rated voltage at maximum rated temperature. An acceleration factor of 8:1 has been used to relate life test data obtained at 200 percent of rated voltage at maximum rated temperature, to rated voltage at rated temperature. Statistical Process Control \(SPC\) techniques are required in the manufacturing process to minimize variation in production of capacitors supplied to the requirements of this specification.

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MIL-PRF-49464C

4.8.3.2.1 Standard voltage conditioning. Voltage conditioning shall consist of applying a minimum of twice the

rated voltage to the unit at the maximum rated temperature +4�C, -0�C for 100 +20, -4 hours. After testing, perform

measurements of 4.8.3.3.

4.8.3.2.2 Optional voltage conditioning. The manufacturer, with approval from the qualifying activity, may perform

an optional voltage conditioning test instead of the standard voltage conditioning tests of 4.8.3.2.1. All conditions of

4.8.3.2.1 apply, with the exception of the voltage applied and the test time. The accelerated condition selected for the

optional voltage conditioning shall be used for the duration of the test. At no time shall a combination of standard and

optional voltage conditioning be allowed on the same samples. The minimum time duration, T(test) minimum, shall

be calculated as follows:

Where: 2 x Erated ≤ Etest ≤ 4 x Erated

Ttest (min.)

800

(Etest / Erated)

Etest = Applied voltage

Erated = Rated voltage of the capacitor

4.8.3.3 Measurements after testing. After completion of the test, the units shall be allowed to stabilize at room

temperature (+25�C) for a period up to 24 hours. After stabilization at room temperature, the capacitance, dissipation

factor, insulation resistance and dielectric withstanding voltage shall be measured as specified in 4.8.4, 4.8.5, 4.8.6,

and 4.8.7, respectively.

NOTES:

1. The power supply shall be capable of supplying the required test voltage.

2. The current limiting device shall be a resistor or a fuse. The current shall be limited to no less than 30

milliamperes (mA) and no more than 10 A.

3. There shall be a voltage monitor that will indicate when the applied voltage drops or increases by more than

5 percent, and shut off the test. The resistance of the voltage monitor shall be a minimum of 10X the

equivalent resistance of the series resistor and the device under test.

4. Each device under test must have a resistor or fuse in series with it. The value of the resistor shall be such

that it does not restrict the power supply's ability to provide the required test voltage to the device under

test (�5 percent).

FIGURE 2. Suggested test circuit.

4.8.4 Capacitance (see 3.7). Unmounted capacitors shall be tested in accordance with method 305 of

MIL-STD-202. The following detail and exception shall apply:

a. Test frequencies: 1 MHz �50 Hz for all capacitors less than or equal to 100 pF.

1 kHz �50 Hz for all other capacitors.

b. Test voltage: A root-mean-square potential of 1.0 �0.2 volts, when no polarizing voltage is applied.