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MIL-PRF-123 Capacitors, Fixed, Ceramic Dielectric, \(Temperature Stable And General Purpose\), High Reliability, General Specification ForThis specification covers the general requirements for high reliability, general purpose \(BX and BR\) and temperature stable \(BP and BG\) ceramic dielectric fixed capacitors, leaded and nonleaded for space, missile, and other high reliability applications. Capacitors covered by this specification may be used in critical frequency determining applications, timing circuits, and other applications where absolute stability is required \(BP and BG\), and in applications where appreciable variations in capacitance with respect to temperature, voltage, frequency, and life can be tolerated \(BX and BR\). Life tests in this specification are performed at two times rated voltage at maximum rated temperature, and an assumed acceleration factor of 8:1 is used to relate life test data obtained at two times rated voltage to performance at rated voltage.

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MIL-PRF-123D
FIGURE 6. Depth of immersion in molten solder.
4.6.14.2 Resistance to soldering heat (nonleaded capacitors) (see 3.18.2). Capacitors shall be tested in
accordance with method 210 of MIL-STD-202. The following details shall apply:
a. Capacitors shall be immersed using procedure 1, two times.
b. Test condition B: Except the solder temperature shall be +230°C, +5°C, -0°C, and the duration shall be 5,
+1, -0 seconds.
c. Cooling time prior to measurement after test: 10 minutes minimum and up to 24 hours maximum.
d. Measurements before test: Capacitance, dissipation factor, and insulation resistance at +25°C shall be
measured and recorded as specified in 4.6.7, 4.6.8, and 4.6.10, respectively.
e. Examination and measurement after test: Capacitors shall meet the requirements of 3.18.2. Capacitance,
dissipation factor, and insulation resistance at +25°C shall be measured and recorded as specified in 4.6.7,
4.6.8, and 4.6.10, respectively.
4.6.15 Voltage-temperature limits (see 3.19). The temperature of each capacitor shall be varied as specified in
table XVIII. Capacitance measurements shall be made at the frequency and voltage specified in 4.6.7. The dc rated
voltage need only be applied to the capacitor in each of step E through step G inclusive, until voltage stability is
reached and the capacitance measurement is made. Capacitance measurements shall be made at each step
specified in table XVIII and at a sufficient number of intermediate points between step B and step G to establish a
true characteristic curve. Capacitance measurements at each temperature shall be taken at 5 minute intervals and
shall be stopped and recorded when two successive readings indicate a capacitance change of less than one
percent.
4.6.15.1 Voltage-temperature limits for quality conformance inspection. Capacitance measurements shall be
made as specified in 4.6.7, except that the measurements shall be made only for steps C, D, E, and G of table XVIII.
TABLE XVIII. Voltage-temperature limit cycle.
Temperature, °C
Step
Voltage, dc
+25 ±2
A
None
-55 ±2
B
None
+25 ±2
C 1/
None
+125 ±2
D
None
+125 ±2
E
Rated
+25 ±2
F
Rated
-55 ±2
G
Rated
1/ Reference point.
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