MIL-DTL-3965H
4.3.2 Methods.
4.3.2.1 AC measurements. AC measurements shall be made at a frequency of 120 ±5 hertz (Hz). The magnitude
of the ac voltage shall be equal to or less than 1.0 volt root mean square (rms). Except as specified in the following,
the dc bias voltage shall be 2.2 +0.0, -1.0 volts for all ac measurements.
a. At the option of the manufacturer, the dc bias voltage may be 2.2 +0.0, -1.0 V dc or 10 percent of
the rated voltage +0.0, -1.0 V dc, whichever is greater, for all styles.
The ratio of ac voltage to dc bias voltage shall be such that no reversal of dc voltage will occur across the capacitor.
4.3.2.2 Reference measurements. When requirements are based on comparative measurements made before
and after conditioning, the reference measurement shall be considered the last measurement made at 25°C ±5°C
prior to conditioning. Unless reference measurements have been made within 30 days prior to the beginning of
conditioning, they shall be repeated.
4.3.3 Power supply. The power supply used for life testing shall have a regulation of ±2 percent or less of the
specified test voltage. The power supply used for dc leakage current measurements shall be stabilized to at least
±100 parts per million. No voltage fluctuations shall occur during measurements that would produce a variation in the
current measurement.
4.4 Qualification inspection. Qualification inspection shall be performed at a laboratory acceptable to the
Government (see 6.3), on sample units produced with equipment and procedures normally used in production.
4.4.1 Sample size. The number of capacitors or brackets to be subjected to qualification inspection shall be as
specified in table V or VI as applicable, or in the appendix to this specification.
4.4.2 Inspection routine.
4.4.2.1 Capacitor submission. The sample shall be subjected to the inspections specified in table V, in the order
shown. Two sample units shall be subjected to the visual and mechanical examination (internal). The remaining
sample units shall be subjected to the subsequent inspections of group I. The sample shall then be divided as
specified in table V for groups II to VI inclusive, and subjected to the inspections for their particular group.
4.4.2.2 Bracket submission. Sample units shall be subjected to the qualification inspection specified in table VI, in
the order shown. Two sample units of each type represented in a sample shall be subjected to the inspection of
group I. The sample units shall then be divided equally into two groups, as specified in table VI and subjected to the
inspection for their particular group. Each type of bracket shall be equally represented in each group. Tests on
brackets may be performed concurrently with those specified for capacitors in 4.4.2.1.
4.4.3 Failures. Failures in excess of those allowed in table V or VI shall be cause for refusal to grant qualification
approval.
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