MIL-PRF-123 Capacitors, Fixed, Ceramic Dielectric, \(Temperature Stable And General Purpose\), High Reliability, General Specification ForThis specification covers the general requirements for high reliability, general purpose \(BX and BR\) and temperature stable \(BP and BG\) ceramic dielectric fixed capacitors, leaded and nonleaded for space, missile, and other high reliability applications. Capacitors covered by this specification may be used in critical frequency determining applications, timing circuits, and other applications where absolute stability is required \(BP and BG\), and in applications where appreciable variations in capacitance with respect to temperature, voltage, frequency, and life can be tolerated \(BX and BR\). Life tests in this specification are performed at two times rated voltage at maximum rated temperature, and an assumed acceleration factor of 8:1 is used to relate life test data obtained at two times rated voltage to performance at rated voltage.

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MIL-PRF-123D

APPENDIX A

h. Unit H: Gap in solder joint under the nail head which reduces lead-to-element interface to less than 90

percent coverage. Rejectable (see figure A-3).

I. Unit I: Diameter of lead wire overhangs side of element. Rejectable (see figure A-3). (Note: Nail head may

overhang.)

j. Unit J: Edge of lead wire does not overhang edge of element, but gap in solder joint under the nail head

reduces lead-to-element interface to less than 90 percent coverage. Rejectable (see figure A-3).

k. Unit K: Center line of nail head tilted greater than 30� beyond center line of chip. Rejectable (see

FIGURE A-1. Acceptable units.

FIGURE A-2. Acceptable only by QC department.