MIL-PRF-39001 Capacitors, Fixed, Mica Dielectric, Established Reliability And Nonestablished Reliability, General Specification ForThis specification covers the general requirements for established reliability \(ER\) and nonestablished reliability \(non-ER\), mica dielectric, fixed capacitors \(see 6.1\). The ER capacitors have a failure rate level \(FRL\) ranging from 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours \(see 1.2.1.7\). The FRL is established at a 90 percent confidence level. The FRL, identified by the applicable symbol specified in table V is referred to operational life at full rated voltage \(see 1.2.1.6\) at 125 degrees C or 150 degrees C, as applicable. An acceleration factor of 25:1 has been used to relate the life test at 150 percent of rated voltage at rated temperature to rated voltage at rated temperature.

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MIL-PRF-39001E

4.7.10.3 Continuous-curve temperature coefficient. As an alternate to the measurements specified in 4.7.10.1, a

continuous curve of capacitance versus temperature may be produced by subjecting the capacitors to a slowly

varying temperature. The temperature shall be varied from 25C to +55C, to 125C or 150C, as applicable, and to

25C. A temperature-sensing device shall be embedded in a dummy capacitor in a manner to assure accurate

internal readings in the capacitor under test. The temperature shall be varied slowly enough to produce a smooth,

uniform curve with no loops at -55C or 125C or 150C, as applicable. Measurements shall be made at a frequency

of 100 kHz �10 kHz. Accuracy shall be as specified in 4.7.10.1.

4.7.11 Thermal shock and immersion (see 3.15).

4.7.11.1 Thermal shock. Capacitors shall be tested in accordance with method 107 of MIL-STD-202. The

following details and exceptions shall apply:

a. Test condition: A, except that elevated temperature shall be 125C +3C, -0C, or 150C, +3C, -0C, as

applicable.

b. Measurement before cycling: Capacitance.

c. Measurement after cycling: Not applicable.

4.7.11.2 Immersion. The temperature cycling shall be followed by immersion cycling in accordance with

method 104 of MIL-STD-202, test condition B. Capacitors shall be visually examined for evidence of deterioration,

permanent damage to leads and case, and corrosion on the leads. Dielectric withstanding voltage, IR, capacitance,

and DF shall then be measured as specified in 4.7.2, 4.7.5.1, 4.7.6, and 4.7.7 respectively.

4.7.12 Shock, specified pulse (see 3.16). Capacitors shall be tested in accordance with

method 213 of MIL-STD-202. The following details shall apply:

a. Mounting: Capacitors shall be rigidly mounted by the body.

b. Test condition: I (100 G (pk), sawtooth).

c. Measurements during shock: During the last shock in each direction, an electrical measurement shall be

made to determine intermittent contacts of 0.5 ms or greater duration or open-circuiting or short-circuiting.

d. Measurements after shock. Capacitors shall be examined for evidence of mechanical damage.

4.7.13 Terminal strength (see 3.17).

4.7.13.1 Pull test. All terminals shall be subject for 5 seconds �1 second, to a pull of 5-pounds +2 ounces, -0

ounces in a direction perpendicular to the leads.

4.7.13.2 Twist test. Capacitors shall be tested in accordance with method 211 of MIL-STD-202, test condition D.

4.7.14 Resistance to soldering heat (see 3.18). Capacitors shall be tested in accordance with

method 210 of MIL-STD-202. The following details and exceptions shall apply:

a. Depth of immersion: Within .250 inch (6.35 mm) of the case.

b. Test condition: C.

c. Cooling time prior to final measurement: 1 minute �10 seconds.

d. Measurements after test: Insulation resistance, capacitance, and DF shall be measured as specified in