MIL-PRF-39001E
4.6.1.2 Group A inspection.
4.6.1.2.1 Non-ER (level C). The manufacturer shall establish and maintain an inspection system to verify that
capacitors meet the IR (25C), capacitance, DF, solderability, and mechanical examination requirements. In-line or
process control may be part of such a system. The inspection system shall also include criteria for lot rejection and
corrective actions. The inspection system shall be verified under the overall MIL-STD-790 QPL system. NOTE:
Since the non-ER (level C) is the ER design without the mandatory conformance system and FRL assessment, the
product is still expected to meet the environmental qualification type requirements (e.g., shock, vibration, or moisture
resistance).
4.6.1.2.2 ER capacitors.
4.6.1.2.2.1 Subgroup 1. Subgroup 1 tests shall be performed on a production lot basis on 100 percent of the
product supplied under this specification. Capacitors failing the tests of subgroup 1 shall be removed from the lot. If,
during the 100 percent inspection, screening requires that more than 8 percent of the capacitors be discarded, the
entire production lot shall be rejected.
4.6.1.2.2.1.1 Manufacturer s production inspection. If the manufacturer performs tests equal to or more stringent
than those specified in subgroup 1 as the final step of their manufacturing process, the subgroup 1 tests may be
eliminated when approved by the qualifying activity. The following criteria must be compiled with:
a. The manufacturer production tests are identical to, or more stringent than, those specified for subgroup 1
tests.
b. One hundred percent of the product shall be subjected to these tests.
c. Failure criteria are identical to, or more stringent than, the subgroup 1 tests.
d. Lot rejection criteria are identical to, or more stringent than, the subgroup 1.
e. Once approved, future changes require approval from the qualifying activity.
4.6.1.2.2.2 Subgroup 2.
4.6.1.2.2.2.1 Sampling plan. Subgroup 2 tests shall be performed on an inspection lot basis. Samples subjected
to subgroup 2 tests shall be selected in accordance with table IX, based on the size of the inspection lot. In the
event of one or more failures, the lot shall be rejected.
4.6.1.2.2.2.2 Rejected lots. The rejected lot shall be segregated from new lots and those lots that have passed
inspection. The rejected lots shall be 100 percent inspected for those quality characteristics found defective in the
sample and any defective found removed from the lot. A new sample of parts shall then be randomly selected in
accordance with table IX. If one or more defects are found in this second sample, the lot shall be rejected and shall
not be supplied to this specification.
4.6.1.2.2.3 Subgroup 3.
4.6.1.2.2.3.1 Sampling plan. Subgroup 3 tests shall be performed on inspection lot basis. The number of
samples selected shall be in accordance with table X. In the event of one or more failures, the lot shall be rejected.
4.6.1.2.2.3.2 Rejected lots. The rejected lot shall be segregated from new lots and those lots that have passed
inspection. The rejected lots shall be 100 percent inspected for those quality characteristics found defective in the
sample and any defective found, removed from the lot. A new sample of parts shall then be randomly selected in
accordance with table X. If one or more defects are found in this second sample, the production lot shall be rejected
and shall not be supplied to this specification.
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