MIL-PRF-39001 Capacitors, Fixed, Mica Dielectric, Established Reliability And Nonestablished Reliability, General Specification ForThis specification covers the general requirements for established reliability \(ER\) and nonestablished reliability \(non-ER\), mica dielectric, fixed capacitors \(see 6.1\). The ER capacitors have a failure rate level \(FRL\) ranging from 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours \(see 1.2.1.7\). The FRL is established at a 90 percent confidence level. The FRL, identified by the applicable symbol specified in table V is referred to operational life at full rated voltage \(see 1.2.1.6\) at 125 degrees C or 150 degrees C, as applicable. An acceleration factor of 25:1 has been used to relate the life test at 150 percent of rated voltage at rated temperature to rated voltage at rated temperature.

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MIL-PRF-39001E

c. Tests during subjection to reduced pressure: A test potential of 100 percent of rated dc voltage for style

CMR04, 500 volts, and 150 percent for all other styles and voltages shall be applied between the terminals

for 60 seconds +15 seconds, -0 second. Surge current shall not exceed 50 mA.

d. Examination after test: Capacitors shall be examined for evidence of damage, arcing, and breakdown.

4.7.5.1 At room ambient temperature (see 3.9.1). Capacitors shall be tested in accordance with

method 302 of MIL-STD-202. The following details shall apply:

a. Test condition: A. (At the option of the manufacturer a higher voltage may be used.)

b. Points of measurement: From terminal to terminal. (Condensed moisture may be removed by a blast of air.)

4.7.5.2 At high ambient temperature (see 3.9.2). Capacitors shall be subjected to the high ambient temperature,

125C +5C, -0C or 150C, +5C, -0C, as applicable, for a period of time sufficient to reach thermal stability and

shall be measured as specified in 4.7.5.1.

4.7.6 Capacitance (see 3.10). Capacitance shall be measured in accordance with method 305 of MIL-STD-202.

The following details shall apply:

a. Test frequency: 1 megahertz (MHz) �1,000 hertz (Hz) when the nominal capacitance is 1,000 pF or less,

and 1 kilohertz (kHz) �100 Hz when the nominal capacitance is greater than 1,000 pF. At the option of the

manufacturer, capacitance measurements may be made at any frequency from 1 kHz to 1 MHz and referred

to measurements at 1 MHz and 1 kHz, as applicable.

b. Limit of accuracy: Shall be �0.2 percent of nominal capacitance value or �0.2 pF, whichever is greater.

4.7.7 DF (see 3.11). Dissipation factor shall be measured at a frequency of 1 MHz �1,000 Hz when the nominal

capacitance is 1,000 pF or less, and 1kHz �100 Hz when the nominal capacitance is greater than 1,000 pF.

Measurement accuracy shall be within �2 percent for DF and within �5 Hz for frequency.

4.7.8 Solderability (see 3.12). Capacitors shall be tested in accordance with method 208 of MIL-STD-202. The

following details may apply:

a. Number of terminations of each part to be tested: Two.

b. Depth of immersion in flux and solder: To a point at which exposed metal is solderable.

c. No physical damage after test.

4.7.9 Vibration (see 3.13).

4.7.9.1 Vibration, high frequency. Capacitors shall be tested in accordance with method 204 of MIL-STD-202.

The following details and exceptions shall apply:

a. Mounting: Capacitors shall be rigidly mounted by the body to vibration-test apparatus.

b. Test condition: B.

c. Measurements during vibration: During the last cycle in each direction, an electrical measurement shall be

made to determine intermittent contacts of 0.5 ms or greater duration or open-circuiting or short-circuiting.

d. Examination and measurements after test: Capacitors shall be examined for evidence of mechanical

damage.