MIL-PRF-39001E
b. The manufacturer submits the failed lot to a 100 percent solder dip using an approved solder dip process in
accordance with 3.4.2.1. Following the solder dip, the electrical measurements required in group A,
subgroup 1 tests shall be repeated on 100 percent of the lot. The PDA for the electrical measurements shall
be as for the subgroup 1 tests.
c. Five additional samples shall be then selected and subjected to the solderability test with zero defects
allowed. If the lot fails this solderability test, the lot shall be considered rejected and shall not be furnished
against the requirements of this specification.
4.6.1.2.2.4.3 Disposition of samples. The solderability test is considered a destructive test and samples
submitted to the solderability test shall not be supplied on the contract.
4.6.1.2.2.5 PPM calculations. The manufacturer shall establish a ppm system in accordance with 3.3.2 for
assessing and calculating average outgoing quality of capacitors. A ppm rate combining DWV, IR (25C),
capacitance, and DF shall be assessed for lots that have passed the group A inspection. The manufacturer s ppm
system shall also address rectification procedures for lots failing ppm assessment. Data from the rectification
system shall not be used to calculate ppm.
4.6.2 Periodic inspection.
4.6.2.1 Group C inspection. Group C inspection shall be performed on sample units which have been subjected
to and have passed group A inspection for FRL M, P, R, and S and shall consist of the tests specified in table XI in
the order shown. The maximum and minimum case size manufactured during a month's production shall be
represented in the sample in at least the approximate ratio of production. Test data obtained shall be reviewed as
part of the complete verification of qualification.
4.6.2.1.1 Sampling plan.
4.6.2.1.1.1 For subgroup 1 and subgroup 2. Seventy-two sample units, representative of a month's production,
shall be taken from production every 2 months, divided into subgroups as listed in table XI for subgroup 1 and
subgroup 2, and subjected to the test specified herein. Allowable failures shall be as specified in table XI.
4.6.2.1.1.2 For subgroup 3. In addition to the tests specified in 4.6.2.1.1.1, a minimum of ten sample units from
each inspection lot shall be subjected to subgroup 3 of table XI. Allowable failures shall be as specified in
MIL-STD-690, table IV, maintenance period B.
4.6.2.1.2 Failures. If the number of failures exceeds the number allowed in table XI or MIL-STD-690, as
applicable, the sample shall be considered to have failed.
4.6.2.1.3 Disposition of sample units. Sample units which have been subjected to group C inspection shall not be
delivered on the contract.
4.6.2.1.4 Noncompliance. If a sample fails to pass group C inspection, the manufacturer shall take corrective
action on the materials or processes, or both, as warranted, and on all units of product which can be corrected and
which were manufactured under essentially the same conditions, with essentially the same materials and processes,
and which are considered subject to the same failure. Acceptance of the product shall be discontinued until
corrective action, acceptable to the Government, has been taken. After the corrective action has been taken, group
C inspection shall be repeated on additional sample units (all inspections, or the inspection which the original
sample failed, at the option of the Government). Group A inspections may be reinstitutued; however, final
acceptance shall be withheld until the group C reinspection has shown that the corrective action was successful. In
the event of failure after reinspection, information concerning the failure and corrective action taken shall be
furnished to the cognizant inspection activity and the qualifying activity.
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