MIL-PRF-123 Capacitors, Fixed, Ceramic Dielectric, \(Temperature Stable And General Purpose\), High Reliability, General Specification ForThis specification covers the general requirements for high reliability, general purpose \(BX and BR\) and temperature stable \(BP and BG\) ceramic dielectric fixed capacitors, leaded and nonleaded for space, missile, and other high reliability applications. Capacitors covered by this specification may be used in critical frequency determining applications, timing circuits, and other applications where absolute stability is required \(BP and BG\), and in applications where appreciable variations in capacitance with respect to temperature, voltage, frequency, and life can be tolerated \(BX and BR\). Life tests in this specification are performed at two times rated voltage at maximum rated temperature, and an assumed acceleration factor of 8:1 is used to relate life test data obtained at two times rated voltage to performance at rated voltage.

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MIL-PRF-123D

APPENDIX A

g. Unit S: This example shows various rejectable characteristics which may be observed on the radial leaded

device (see figure A-7). Description of the numbered defects are as follows:

(1) Lead-to-element interface of less than 80 percent is not acceptable.

(2) Cut, dent, or smash in the lead wire exceeding .050 inch (1.27 mm) in length or .005 inch (0.13 mm) in

depth is rejectable.

(3) Element is not properly seated in the "saddle". Gaps in excess of .015 inch (0.38 mm) are rejectable.

(4) Chip-outs in the ceramic surface which expose electrodes are not acceptable.

FIGURE A-4. Ideal condition (acceptable unit).

FIGURE A-5. Rejectable units.

FIGURE A-6. Chip alignment.

FIGURE A-7. Rejectable characteristics.