MIL-C-5G
TABLE VII. Qualification inspection.
Examination or test
Requirement
Method
Number of
Number of
paragraph
paragraph
sample
defectives
units to be
allowed
inspected
Group I
Visual and mechanical examination
1/ 43
Dielectric withstanding voltage
1
Barometric pressure
Insulation resistance
Dissipation factor
Capacitance
Group II
High frequency vibration
12
1
Thermal shock and immersion
4.6.8.1 to
Group III
Shock (specified pulse)
Solderability
12
1
Terminal strength
Moisture resistance
Group IV
Temperature coefficient and capacitance drift
4.6.13.1 to
2/ 18
1
Low-temperature storage and life
4.6.14 and
1/ One additional specimen is included to permit substitution for the allowable defective in group I.
2/ Only 12 specimens are to be subjected to the temperature-coefficient and capacitance-drift test, 6 of which shall
be of the low capacitance sample units when single style qualification is sought.
4.5 Conformance inspection.
4.5.1 Inspection of product for delivery. Inspection of product for delivery shall consist of group A and group B
inspection.
4.5.1.1 Inspection lot. An inspection lot shall consist of capacitors in one or more styles. The sample selected
from the lot shall be representative of the styles in the lot. Styles may be grouped as follows:
Group
Styles
1
CM04, CM05, CM06, CM07, CM08, CM09, CM10, CM11, CM12, and CM13
2
CM15
4.5.2 Rejected lots. If an inspection lot is rejected, the supplier may withdraw the lot, rework it to correct the
defects, or screen out defectives and resubmit for re-inspection. Such lots shall be kept separate from new lots and
shall be clearly identified as re-inspected lots. Rejected lots shall be inspected, using tightened inspection.
4.5.3 Group A inspection. Group A inspection shall consist of the examinations and tests specified in table VIII, in
the order shown.
4.5.3.1 Sampling plan. A sample of parts shall be randomly selected in accordance with table IX. If one or more
defects are found, the lot shall be rescreened and defects removed. After screening and removal of defects, a new
sample of parts shall be randomly selected in accordance with table IX. If one or more defects are found in the
second sample, the lot shall be rejected and shall not be supplied to this inspection.
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