MIL-C-5G
c. Polarization and load: Not applicable.
d. Final measurements: Upon completion of step 6 of the final cycle, capacitors shall be maintained at a
temperature of 25° +10° -5°C and a relative humidity of 20 to 80 percent for a period of 4 to 24 hours; the
dielectric withstanding voltage, insulation resistance, dissipation factor, and capacitance shall then be measured
4.6.13 Temperature coefficient and capacitance drift (see 3.16).
4.6.13.1 For qualification inspection. Capacitance measurements shall be made in accordance with 4.6.6 (a
frequency of 100 kHz ± 1 percent may be used as an alternate) at the following temperatures, in the order listed:
Temperature, °C
Temperature, °C
+25 ± 2
+65 ± 2
-55 +0, -2
+85 +2, -0 (For temperature ranges N, O, and P)
-40 ± 2
+125 +2, -0 (For temperature ranges O and P)
-10 ± 2
+150 +2, -0 (For temperature range P)
+25 ± 2
+25 ± 2
+45 ± 2
The measurement at each temperature shall be recorded when two successive readings taken at 5 minute intervals
are within ±(0.025 percent of nominal capacitance ±0.05 pF) of each other. The second reading is then taken as the
capacitance at the specified test temperature.
4.6.13.1.1 Temperature coefficient. The temperature coefficient shall be computed as follows:
(C 2 - C1 ) X 10 6
TC =
(T2 - T1 ) X C1
Where: TC = Temperature coefficient (in parts per million per degree C).
C1 = Capacitance (in pF) at the middle 25°C (reference) temperature.
C2 = Capacitance (in pF) at test temperature.
T1 = 25°C.
T2 = Test temperature (in degrees C).
4.6.13.1.2 Capacitance drift. Capacitance drift shall be computed by dividing the greatest single difference
between any two of the three values recorded at 25°C by the second value recorded at 25°C.
4.6.13.1.3 Continuous-curve temperature coefficient. As an alternate to the measurements specified in 4.6.13.1, a
continuous curve of capacitance versus temperature may be produced by subjecting the capacitors to a slowly
varying temperature. The temperature shall be varied from +25°C, to -55°C, to the applicable elevated temperature
(see 3.1 and table IV), to +25°C. A temperature-sensing device shall be embedded in a dummy capacitor in a
manner to assure accurate internal reading in the capacitor under test. The temperature shall be varied slowly
enough to produce a smooth, uniform curve with no loops at -55°C or the applicable elevated temperature (see 3.1
and table IV). Measurements shall be made at a frequency of 100 ± 10 kHz. Accuracy shall be as specified in
4.6.13.1.
4.6.13.2 For conformance inspection. Capacitance measurements shall be made as specified in 4.6.13.1, or
4.6.13.1.3, except that only five temperature exposures at +25°C, -55°C, +25°C, the applicable elevated temperature
4.6.13.2.1 Temperature coefficient. The temperature coefficient shall be computed as specified in 4.6.13.1.1.
4.6.13.2.2 Capacitance drift. Capacitance drift shall be computed as specified in 4.6.13.1.2.
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