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MIL-PRF-49137 Capacitors, Fixed, Electrolytic \(Solid Electrolyte\), Tantalum, Molded, Conformal Coated And Metal Cased With Plastic End-Fill, Nonhermetically Sealed, General Specification ForThis specification covers the general requirements for fixed, electrolytic \(solid electrolyte\), tantalum, molded, conformal coated and metal cased with plastic end-fill nonhermetically sealed capacitors, primarily intended for filter, bypass, coupling, and other applications where the alternating current \(ac\) component is small compared to the direct current \(dc\) rated voltage. These capacitors are intended to be used only where supplemental moisture protection is provided or for noncritical applications where hermetic moisture protection is not required.

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MIL-PRF-49137E

4.6.1.3 Group A inspection. Group A inspection shall consist of the inspections specified in table V, in the order

shown.

TABLE V. Group A inspection.

Test

Requirement

Sampling

Inspection

method

paragraph

procedure

paragraph

Subgroup 1

DC leakage

20 samples

Capacitance

0 failures

Dissipation factor

3.9

4.8.6

Subgroup 2

Visual and mechanical

3.1, 3.3, 3.3.1, 3.4,

4.8.1

inspection

3.4.1, 3.4.2, 3.21

13 samples

and 3.23

0 failures

Construction analysis

3.6

4.8.3

(metal cased units only)

Subgroup 3

13 samples

Solderability

3.19

4.8.16

0 failures

4.6.1.3.1 Subgroup 1 and subgroup 2.

4.6.1.3.1.1 Sampling plan. The sampling plan for subgroup 1 and subgroup 2 shall be as specified in table V.

4.6.1.3.1.2 Rejected lots. The rejected lot shall be segregated from new lots and those lots that have passed

inspection. The rejected lot shall be 100 percent inspected for those quality characteristics found defective in the

sample and any defective found shall be removed from the lot. A new sample of parts shall then be randomly

selected in accordance with table V. If one or more defects are found in this second sample, the lot shall be rejected

and shall not be supplied to this specification.

4.6.1.3.2 Subgroup 3 (solderability).

4.6.1.3.2.1 Sampling plan. Thirteen samples shall be selected randomly from every inspection lot and subjected to

the subgroup 3 solderability test. The manufacturer may use electrical rejects from the subgroup 1 screening test for

all or part of the samples to be used for solderability testing. If there are one or more defects, the lot shall be

considered to have failed.

4.6.1.3.2.2 Rejected lots. In the event of one or more defects, the inspection lot shall be rejected. The

manufacturer may use one of the following options to rework the lot:

a. Each production lot that was used to form the failed inspection lot shall be individually submitted to the

solderability test as required in 4.6.1.3.2.1. Production lots that pass the solderability test are available for

shipment. Production lots failing the solderability test can be reworked only if submitted to the solder dip

procedure in item 4.6.1.3.2.2b.

b. The manufacturer shall submit the failed lot to a 100 percent solder dip using an approved solder dip process

in accordance with 3.4.2.1. Following the solder dip, the electrical measurements required in group A,

subgroup 1 tests shall be repeated on another 125 samples with no defects allowed. Thirteen additional

samples shall then be selected and subjected to the solderability test with no defects allowed. If the lot fails

this solderability test, the lot shall be considered rejected and shall not be furnished against the requirements

of this specification.

4.6.1.3.2.3 Disposition of samples. The solderability test is considered a destructive test and samples submitted to

the solderability test shall not be supplied on the contract.