MIL-C-25 Capacitors, Fixed, Paper Or Plastic Dielectric, Direct Current, \(Hermetically Sealed In Metal Cases\), General Specification ForThis specification covers the general requirements for direct-current \(dc\) paper-dielectric, fixed capacitors hermetically sealed in metal cases, intended primarily for filter, by-pass, and blocking purposes where the alternating-current \(ac\) component of the impressed voltage is small with respect to the dc voltage rating.

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MIL-C-25F

4.3 Inspection conditions. Unless otherwise specified herein, all inspections shall be performed in accordance

with the test conditions specified in "GENERAL REQUIREMENTS" of MIL-STD-202.

4.4 Qualification inspection. Qualification inspection shall be performed at a laboratory acceptable to the

Government (see 6.3).

4.4.1 Sample size. The number of capacitors to be submitted for qualification inspection and the amount of

impregnant of filling compound shall be as specified in appendix A of this specification. The sample shall be taken

from a production run and shall be produced with equipment and procedures normally used in production.

4.4.2 Inspection routine.

4.4.2.1 Capacitor submission. Sample capacitors shall be subjected to the examinations and tests specified in

table VII, in the order shown. Two specimens of each type represented in a sample shall be subjected to visual and

mechanical examination (internal), and the remaining capacitors shall be subjected to the remainder of the group I

examination and tests. The capacitors shall then be divided into test groups as specified in table VII and subjected to

the tests for their particular group.

4.4.2.2 Impregnant or filling compound. The sample of impregnant or filling compound (see A.2.1.3) shall be

subjected to the flashpoint of impregnant or filling compound test specified in table VII.

4.4.2.3 Capacitors with alternate terminals, case materials, and applied finish. Sample capacitors (see A.2.1.4 to

A.2.1.6) shall be subjected to the examinations and tests of groups I, II, and III specified in table VII, in the order

shown. After completion of the group I tests, the specimens shall be divided into two equal groups and subjected to

the test specified in groups II and III. No defectives shall be allowed for group I, and 1 defective shall be allowed for

each of groups II and III.

4.4.3 Defectives. Defectives in excess of those allowed in table VII and 4.4.2.3 shall be cause for refusal to grant

qualification. If a multiple-section capacitor has a defect in any section, it shall be considered as one defective.