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MIL-PRF-87164 Capacitors, Fixed, Mica Dielectric, High Reliability, General Specification For \(See Notice 1 For Replacement Information\)This specification covers the general requirements for high reliability, mica dielectric, fixed capacitors for space, missile, and other high reliability applications. Capacitors covered by this specification may be used in critical applications where the utmost in stability and dependability is required and where variations in capacitance with respect to temperature, voltage, frequency, and life cannot be tolerated \(see 6.1\). An acceleration factor of 25:1 has been used to relate life test data obtained at 150 percent of rated voltage at rated temperature to rated voltage at rated temperature.

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MIL-PRF-87164A
TABLE IV. Qualification inspection.
Number of
Number of
defectives
sample
Inspection
Requirement
Method
allowed 1/
units to be
Paragraph
paragraph
inspected
Group I 2/
Dielectric withstanding voltage
3.6
4.7.2
125
0
High voltage stabilization
3.11
4.7.7
Group II 2/
4.7.1
3.1, 3.4 to 3.5.2 inclusive,
Visual and mechanical examination 3/
3.24 to 3.25 inclusive
125 4/
4.7.3
3.7
Barometric pressure
0
4.7.4
3.8
Insulation resistance
4.7.5
3.9
Capacitance
4.7.6
3.10
Dissipation factor
Group III
3.12
4.7.8
Solderability
3.13
4.7.9
Vibration, high frequency
4.7.10
18
1
3.14
Temperature coefficient and
capacitance drift
Thermal shock and immersion
4.7.11
3.15
Group IV
4.7.12
3.16
Shock, specified pulse
4.7.13
18
1
3.17
Terminal strength
4.7.14
3.18
Moisture resistance
Group V
Life (accelerated conditions)
3.19
4.7.15.1
79
1
Group VI
Fungus 5/
3.20
4.7.16
5
Resistance to solvents
3.21
4.7.17
0
Resistance to soldering heat
3.22
4.7.18
5
1/
A sample unit having one or more defects shall be considered as a single defective.
2/
Nondestructive tests.
3/
Marking defects are based on visual examination only and shall be charged only for illegible, incomplete, or
incorrect marking.
4/
Sample units shall be those that have passed group I inspection.
5/
Certification of fungus resistance may be substituted for testing.
9



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