MIL-PRF-87164A
4.3 Inspection conditions and methods.
4.3.1 Conditions. Unless otherwise specified herein, all inspections shall be performed in accordance with the
test conditions specified in the "GENERAL REQUIREMENTS" section of MIL-STD-202.
4.3.2 Methods.
4.3.2.1 Reference measurements. When requirements are based on comparative measurements made before
and after conditioning, the reference measurement shall be considered the last measurement made at 25°C ±5°C
prior to conditioning. Unless reference measurements have been made within 30 days prior to the beginning of
conditioning, they shall be repeated.
4.3.3 Power supply. The power supply used for life testing shall have a regulation of ±2 percent or less of the
applicable applied test voltage. The power supply used for dc leakage current measurements shall be stabilized to
at least ±100 ppm. No voltage fluctuations shall occur during measurements that would produce a variation in the
current measurement.
4.4 Qualification inspection. Qualification inspection shall be performed at a laboratory acceptable to the
Government (see 6.3), on sample units produced with equipment and procedures normally used in production. The
decision as to whether or not the product will be included in the QPL will be made after successful completion of the
2,000-hour life test.
4.4.1 Sample size. The number of sample units comprising a sample of the capacitors to be submitted for
qualification inspection shall be as specified in table IV, or in appendix A to this specification. The sample shall be
taken from a production run and shall be produced with equipment and procedures normally used in production.
Each capacitor style shall be qualified separately.
4.4.2 Test routine. Sample units shall be subjected to the qualification inspection specified in table IV, in the
order shown. All sample units shall be subjected to the group I and group II tests. These sample units shall then be
divided as shown in table IV for group III to group VI inclusive, and subjected to the tests for that particular group.
4.4.3 Failures. Failures in excess of those allowed in table IV shall be cause for refusal to grant qualification
approval.
4.4.4 Qualification. A manufacturer shall be considered qualified for the CMS03, CMS04, CMS05, CMS06, and
CMS07 if they are presently qualified to the R failure level of MIL-PRF-39001/5 for the CMR04, CMR05, and CMR06
and meets the following conditions:
a.
Passes the qualifying activity audit for CMS style capacitors.
b.
Successfully completes group C inspection (table VIII) for the lowest (lowest value need not be less than 47
pF) and highest capacitance values for each different style manufactured.
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