MIL-PRF-20M
(2) If the 200 sample units (or 100 percent of the lot, whichever is less) fail group A, subgroup 1
post-electrical tests, these tests shall be performed on 100 percent of the lot. The lot must meet the 5
percent PDA requirements as specified in 4.6.1.2.1.1. If the PDA requirements are not met, the lot shall
be considered rejected and shall not be furnished against the requirements of this specification. If the
PDA requirements are met, 5 sample units shall be subjected to the solderability testing criteria of
4.6.1.2.1.3.3 Disposition of samples. The solderability test is considered a destructive test and samples submitted
to the solderability test shall not be supplied on the contract or order.
4.6.1.2.1.4 Subgroup 4 (FRL "S" only). The subgroup 4 test shall be performed on all capacitors offered for
inspection. Capacitors not meeting the inspection criteria shall be removed from the production lot and shall not be
supplied to this specification.
4.6.1.2.1.5 PPM calculations. The manufacturer shall establish a ppm system in accordance with 3.3.2 for
assessing and calculating average outgoing quality of capacitors. A ppm rate combining capacitance, dissipation
factor, insulating resistance (IR) (25°C), and DWV shall be assessed for lots that have passed the group A inspection.
The manufacturer's ppm system shall also address rectification procedures for lots failing ppm assessment. Data
from the rectification process shall not be used to calculate ppm.
4.6.1.2.2 Non-ER capacitors.
4.6.1.2.2.1 Subgroup 1 and subgroup 2 tests.
4.6.1.2.2.1.1 Sampling plan. The sampling plan for subgroup 1 and subgroup 2 shall be as specified in table VII.
4.6.1.2.2.1.2 Rejected lots. If an inspection lot for subgroup 1 or subgroup 2 is rejected, the manufacturer may
rework the inspection lot to correct the defects, or screen out the defective units and resubmit the lot for reinspection.
If one or more defects are found during this reinspection, the lot shall be rejected and shall not be supplied to this
specification. Such lots shall be separated from new lots, and shall be clearly identified as reinspected lots.
TABLE VII. Group A inspection (Non-ER).
Requirement
Test method
Inspection
Sampling procedure
paragraph
paragraph
Subgroup 1
Capacitance
125 samples
Dissipation factor
0 failure
Dielectric withstanding voltage
Insulation resistance
Subgroup 2
Visual and mechanical examination:
Material
13 samples
Physical dimensions
0 failures
Marking 1/
Workmanship
Subgroup 3
Solderability
5 samples
0 failures
1/ Marking defects are based on visual examination only.
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