MIL-PRF-20M
TABLE IV. Qualification inspection.
Number of
Number of
sample
Requirement
Test method
defectives
Inspection
units to be
paragraph
paragraph
permitted 1/
inspected
Group I 2/
Thermal shock and voltage conditioning
All units
Not applicable
Radiographic inspection (FRL S only)
All units
Not applicable
Group II 2/
Visual and mechanical examination:
Material, design, and construction
Workmanship
Physical dimensions and marking 3/
37 (non-ER)
1
Capacitance
49 (ER)
Dissipation factor
4/
Dielectric withstanding voltage
Barometric pressure (reduced)
Insulation resistance
Group III
Temperature coefficient and capacitance
drift
12
1
Shock, specified pulse
Vibration, high frequency
Thermal shock and immersion
Group IV
Terminal strength
Resistance to soldering heat
6
1
Moisture resistance
Group V 5/
Solderability
Marking legibility (laser marking only)
6
1
Resistance to solvents (ink marking only)
Fungus 6/
Group VI
Life (at elevated ambient temperatures)
12 (non-ER)
1
24 (ER)
1/ A sample unit having one or more defects will be charged as a single defective.
2/ Group I and group II examinations and tests are nondestructive.
3/ Marking defects are based on visual examination only and shall be charged only as illegible, incomplete, or
incorrect marking. Provisions to reject unmarked parts will also be made.
4/ One additional sample unit is included in each sample to permit substitution for the failure allowed in group II (37
sample units for non-ER styles active for new design; 31 sample units for non-ER styles inactive for new
design).
5/ Applicable to active for new design styles only.
6/ Certification of fungus resistance may be substituted for testing.
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