MIL-PRF-14409J
TABLE II. Qualification inspection.
Number of
Number of
sample units
Requirement
Method
Examination or test
failures 1/
to be
paragraph
paragraph
inspected
Group I
Thermal shock (styles PC21, PC22, PC23,
PC24, PC26, PC27, PC28, PC29, PC30,
PC32, and PC34)
Visual and mechanical examination 2/ 3/
4.5.2
1
to 3.26.1
49 4/
Capacitance 3/
Change of capacitance
Insulation resistance 3/
Dielectric withstanding voltage 3/
Quality factor (Q) 3/
Driving torque 3/
Group II
Temperature coefficient and capacitance drift
Thermal shock
12
1
Immersion 5/
Salt atmosphere (corrosion)
Group III
Torque, bushing strength 6/
Low-temperature storage
12
1
Shock (specified pulse)
Vibration, high frequency
Group IV
2
Barometric pressured (reduced)
(when applicable)
12
1
Moisture resistance
Terminal strength
Resistance to soldering heat (printed
circuit mount types only, see 3.1)
Group V
Seal 5/
12
1
Rotational life
Solderability 7/
1/
A sample unit having one or more defects will be charged as a single failure.
2/
Marking will be considered defective if found to be illegible during visual inspection.
3/
Nondestructive test.
4/
One additional sample unit is included in each sample of 49 capacitors to permit substitution for the allowable
failure in group I.
5/ Sealed units only.
6/ Panel-mount units only.
7/ All solderable terminals.
7
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