MIL-PRF-11693E
6.3 Qualification. With respect to products requiring qualification, awards will be made only for products that are,
at the time of award of contract, qualified for inclusion in Qualified Products List whether or not such products have
actually been so listed by that date. The attention of the contractors is called to these requirements, and
manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested
for qualification in order that they may be eligible to be awarded contracts or orders for the products covered by this
specification. Information pertaining to qualification of products may be obtained from the DLA Land and Maritime,
ATTN: VQP, PO Box 3990, Columbus, OH 43218-3990, or by e-mail to vqp.chief@dla.mil. An online listing of
products qualified to this specification may be found in the Qualified Products Database (QPD) at
6.4 Insertion loss for ideal capacitors. The insertion loss of ideal capacitors for capacitance values from 0.001 to
100 µF, inclusive, and frequency range from 0.01 to 1,000 megahertz, inclusive, may be determined from figure 3
(see 4.7.8).
6.5 Lockwasher. External tooth-type lockwashers should be used for all applications (see 3.1), except where
space limitations, appearance, or other special conditions necessitate the use of internal tooth-type or split-type
lockwashers. Internal tooth-type lockwashers should not be used with binder head screws. Screws or nuts with
captive lockwashers will be permitted, provided that replacement with common-type screws and lockwashers or nuts
and lockwashers may be readily effected. Soldering lug and lockwasher combinations should not be used.
6.6 Definitions.
6.6.1 Radio interference. Radio interference is defined as undesired conducted or radiated electrical disturbances,
including transients, within the range of frequencies covered by this specification, which may interfere with the
operation of electrical or electronic communication equipment or other electronic equipment.
6.6.2 Hermetic sealing. For the purpose of this specification, a hermetically sealed capacitor is one in which the
capacitance element is contained within a sealed enclosure of ceramic, glass or metal, or combinations thereof,
where sealing is accomplished by material fusion, welding, brazing or soldering.
6.7 Supersession data. ER capacitors of this specification supersede similar non ER items (CZR23 for CZ23, and
CZR24 for CZ24) of this specification and similar items from MIL-C-39011, (Capacitors, Feed Through, Radio-
Interference Reduction, ER).
6.8 Required construction.
Extended foil: Aluminum foil electrodes separated by paper or plastic or paper-plastic dielectric and
noninductively wound.
6.9 Tin whisker growth. The use of alloys with tin content greater than 97 percent, by mass, may exhibit tin
whisker growth problems after manufacture. Tin whiskers may occur anytime from a day to years after manufacture
and can develop under typical operating conditions, on products that use such materials. Conformal coatings applied
over top of a whisker-prone surface will not prevent the formation of tin whiskers. Alloys of 3 percent lead, by mass,
have shown to inhibit the growth of tin whiskers. For additional information on this matter, refer to ASTM-B545,
(Standard Specification for Electrodeposited Coatings of Tin).
6.10 Subject term (key word) listing.
Dielectric withstanding voltage
Dissipation factor
Insulation resistance
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