MIL-PRF-11693E
e. Measurement during and after dielectric withstanding voltage: after the test, capacitors shall be visually
examined for external evidence of damage, arcing, or breakdown.
4.7.4.2 For acceptance inspection. Capacitors shall be tested as specified in 4.7.4.1, except that, at the option of
the manufacturer, a test voltage of 250 percent of the rated dc voltage may be applied for a period of not less than 1
second.
4.7.5 Insulation resistance (see 3.9). Capacitors shall be tested in accordance with method 302 of MIL-STD-202.
The following details and exceptions shall apply:
a. Test potential: A potential equal to the rated voltage (see 3.1) or 500 volts dc, whichever is less.
b. Special conditions: Capacitors shall be tested at the applicable high ambient test temperature (see table II),
and at +25°C or corrected thereto.
c. Points of measurement: Between either terminal and the case.
4.7.6 Capacitance (see 3.10). Capacitors shall be tested in accordance with method 305 of MIL-STD-202. The
following details shall apply:
a. Test frequency: 1 kHz ±100 Hz for capacitors whose nominal capacitance is 1 µF or less, and 60 ±6 Hz for
capacitors whose nominal capacitance is more than 1 µF.
b. Limit of accuracy: Within ±2 percent.
4.7.7 Dissipation factor (see 3.11). The dissipation factor of each capacitor shall be measured at a root-mean-
square (rms) voltage not greater than 20 percent of the rated dc voltage. Measurement shall be made at a frequency
of 1 kHz ±100 Hz for capacitors whose nominal capacitance is more than 1 µF. Measurement accuracy shall be
within ±0.1 percent absolute.
4.7.8 Insertion loss (see 3.12). Capacitors shall be tested in accordance with MIL-STD-220. Measurements shall
be taken at the frequencies specified (see 3.1).
4.7.9 DC resistance (see 3.13). The dc resistance shall be measured directly using a Kelvin bridge or indirectly
using the voltmeter-ammeter method, ammeter-potentiometer method, or other suitable means. The point of contact
shall be along the lead, where the lead is normally connected in an actual circuit, except that for axial-wire leads, the
contact shall be made 5/8 ±1/8 inch from the insulator. The maximum allowable measurement error shall be 5
percent.
4.7.10 Resistance to soldering heat (see 3.14).
a. Depth of immersion in molten solder: Within .062 ±.031 inch of the seal or case.
b. Test condition: B.
c. Cooling time prior to measurement after test: 1 hour.
d. Measurement after test: capacitance to ground and coil continuity.
4.7.11 Salt atmosphere (corrosion) (see 3.15). Capacitors shall be tested in accordance with method 101
of MIL-STD-202, test condition B. The salt solution concentration shall be 5 percent. After this test, capacitors shall
be visually examined for corrosion and obliteration of marking.
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