MIL-PRF-83421E
4.7.2 Burn-in (see 3.1 and 3.6). Capacitors shall be tested under accelerated voltage conditions as specified in
4.7.24, with the following exceptions:
a. AC burn-in, when applicable: Details are specified in specification sheet (see 3.1).
b. DC burn-in: Shall be exposed to a temperature of +125°C with 140 percent, minimum of dc derated voltage
for 16 hours, minimum.
TABLE V. Group B inspection.
Test
Number of sample
Number of defects
Requirement
method
Inspection
units to be
permitted
paragraph
paragraph
inspected
Subgroup 1
Insulation resistance (at applicable maximum
12 samples
1
rated temperature)
every 2 months
Temperature coefficient
10 per inspection
Subgroup 2
1/
lot minimum
Life
Subgroup 3
10 per inspection
AC conditioning (when specified, see 3.1)
lot minimum,
Equivalent series resistance 2/
1
unless otherwise
Dissipation factor
specified (see 3.1)
Insulation resistance
Subgroup 4
2 samples per each
1
Vibration, high frequency
case diameter
Vibration, random 3/
Subgroup 5
Salt spray (corrosion) 4/ 5/
6
Immersion 4/ 5/
Shock (specified pulse)
Resistance to soldering heat 5/
6
1
Moisture resistance 5/
Dielectric absorption (when specified, see
3.1) 5/
6
Terminal strength 5/
Resistance to solvents 5/
1/
See MIL-STD-690 for number of defectives permitted.
2/
For styles CRH11, CRH12, and CRH13 only.
3/
Unless otherwise specified, random vibration is optional (see 3.1).
4/
One-half of the sample units shall be tested with the insulating sleeve removed.
5/
If the manufacturer can demonstrate that this test has been performed five consecutive times with zero failure, this
test, with the approval of the qualifying activity, can be deleted. The manufacturer, however, shall perform this
test every 3 years after the deletion as part of long term design verification. If the design, material, construction
processing of the part is changed, or if there are any quality problems, the qualifying activity may require
resumption of the specified testing. Deletion of testing does not relieve the manufacturer from meeting the test
requirements in case of dispute.
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