MIL-PRF-83421E
TABLE II. Qualification inspection - Continued.
Test
Number of sample
Number of defects
Requirement
method
units to be
Inspection
permitted 1/
paragraph
paragraph
inspected
Group III
Vibration, high frequency
6
Salt atmosphere (corrosion) 7/
Immersion 7/
Group IV
Solderability
6
1
Shock (specified pulse)
Resistance to soldering heat
Moisture resistance
Group V
6
Terminal strength
Low temperature life
Group VI
4
1
Fungus 8/
4
Resistance to solvents
Group VII
33
Temperature coefficient
1
Life (accelerated conditions)
Life (rated conditions)
30
Group VIII 2/
24
1
AC conditioning
Group IX
1
0
Flash point of impregnant (when specified, see 3.1)
Group X (when applicable)
10/
0
Vibration, random 9/
1/ A sample unit having one or more defects shall be considered as a single defect.
2/ Group VIII for styles CRH11, CRH12, and CRH13 only. Group I and group II samples shall be 113 minimum.
3/ This total shall be determined by the number of capacitors tested for random vibration in group X. Additional
samples over the minimum should be included to allow for any failures.
4/ Nondestructive tests.
5/ Marking defects are based on visual inspection only and shall be charged only for illegible, incomplete, or incorrect
marking. Any subsequent electrical defects shall not be used as a basis for determining marking defects.
6/ Equivalent series resistance applicable to styles CHR11, CHR12, and CHR13.
7/ One-half of the sample units shall be tested with the insulating sleeves removed.
8/ Certification of fungus resistance may be substituted for testing.
9/ Unless otherwise specified, random vibration is optional (see 3.1).
10/ When applicable, an additional three sample units of the longest case length of each diameter for which
qualification is sought shall be required for group X testing.
10
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