MIL-PRF-83421 Capacitors, Fixed, Metallized, Plastic Film Dielectric, \(Dc, Ac, Or Dc And Ac\), Hermetically Sealed In Metal Cases Or Ceramic Cases, Established Reliability, General Specification ForThis specification covers the general requirements for established reliability \(ER\), metallized plastic film dielectric, fixed capacitors, hermetically sealed in metal or ceramic cases. Capacitors covered by this specification have failure rate levels \(FRL\) established in accordance with MIL-STD-690. The reliability for each level is identified by a symbol in accordance with table I. These FRLs are established at a 90 percent confidence level and maintained at a 10 percent producer\'s risk and, unless otherwise specified \(see 3.1\), are based on life tests performed at maximum rated voltage at maximum rated temperature. Unless otherwise specified \(see 3.1\), an acceleration factor of 5:1 has been used to relate life-test data obtained at 140 percent of rated voltage at maximum rated temperature, to rated voltage at maximum rated temperature \(see 6.1\). A part per million \(PPM\) quality system is used for documenting and reporting the average outgoing quality of capacitors supplied to this specification. Statistical process control \(SPC\) techniques are required in the manufacturing process to minimize variation in production of capacitors supplied to the requirements of this specification.

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MIL-PRF-83421E

4.6.1.1 Inspection and production lot.

4.6.1.1.1 Inspection lot. An inspection lot shall consist of all capacitors from the same production line or lines, of

one or more styles from the same specification sheet, not less than the minimum number of dielectric layers, and

offered for inspection during a single work month. The minimum number of dielectric layers is the number of layers

used in the sample units submitted for qualification. Each lot shall be kept separate from every other lot. The sample

selected from the lot shall be representative of the capacitance values and case sizes in the lot. All sample units

belonging to a lot shall be identified by means of a code symbol (either letters or numbers, at the option of the

manufacturer).

4.6.1.1.2 Production lot. A production lot shall consist of capacitors of the same style, voltage rating, and nominal

capacitance value. Manufacture of all parts in the lot shall have been started, processed, assembled, and tested as a

group. Lot identity shall be maintained throughout the manufacturing cycle.

4.6.1.2 Group A inspection. Group A inspection shall consist of the examination and tests specified in table III.

4.6.1.2.1 Subgroup 1 tests. Subgroup 1 tests shall be performed on a production lot basis on 100 percent of the

product supplied under this specification. Lots having more than 5 percent total rejects shall not be furnished on

contracts. A failure is defined as capacitance value exceeding �20 percent of its nominal value, insulation resistance

(IR) less than 100 megohms, or dissipation factor (DF) exceeding the limits specified after 10,000-hour life.

4.6.1.2.1.1 Manufacturer's production inspection. If the manufacturer performs tests similar to those specified in

subgroup 1, table III, as the final step of the production process, group A, subgroup 1 inspection may be waived and

the data resulting from the manufacturer's production tests may be used instead. Authority to waive the subgroup 1

inspection shall be granted by the qualifying activity only. The following criteria shall be complied with:

a. Tests conducted by the manufacturer during production shall be clearly identical to or more stringent than that

specified for subgroup 1. Test conditions shall be equal to or more stringent than those specified for

subgroup 1 tests.

b. Manufacturer subjects 100 percent of the product supplied under this specification to the production tests.

c. The parameters measured and the failure criteria shall be the same or more stringent than those specified

herein.

d. The lot rejection criteria are the same or more stringent than those specified herein.

e. The manufacturer shall make available all information concerning the test procedures and instrumentation

used in the production tests. The manufacturer shall also make available to the Government all records of all

detail test data resulting from production tests.

f. Once approved, the manufacturer shall not change the test procedures or criteria without prior notification and

concurrence by the qualifying activity.