MIL-PRF-19978/3H
Terminal strength: Method 211 of MIL-STD-202, test condition letters A and E.
Stability at low and high temperatures:
Low temperature:
Test temperature - -55°C (F and G) or -65°C (E and K).
Capacitance change (max) - -10 percent.
High temperature:
Test temperature - +85°C (E, F, and G) or +125°C (K).
Capacitance change (max) - +10 percent.
Life:
Capacitance change (max) - +10 percent.
Resistance to soldering heat: Not applicable.
TABLE I. Terminal-to-terminal insulation resistance.
Capacitance rating
Minimum insulation resistance
Characteristic E
At 25°C
0 to 0.6 microfarad
25,000 megohms
Greater than 0.6 microfarad
15,000 megohm-microfarads 1/
At 85°C
0 to 0.15 microfarad
2,000 megohms
Greater than 0.15 microfarad
300 megohm-microfarads 1/
Characteristic K
At 25°C
0 to 0.6 microfarad
25,000 megohms
Greater than 0.6 microfarad
15,000 megohm-microfarads 1/
At 125°C
0 to 0.08 microfarad
250 megohms
Greater than 0.08 microfarad
20 megohm-microfarads 1/
Characteristic F
At 25°C
0.33 microfarad and less
6,000 megohms
Greater than 0.33 microfarad
2,000 megohm-microfarads 1/
At 85°C
0.033 microfarad and less
600 megohms
Greater than 0.033 microfarad
20 megohm-microfarads 1/
Characteristic G
At 25°C
0.33 microfarad and less
4,500 megohms
Greater than 0.33 microfarad
1,500 megohm-microfarads 1/
At 85°C
0.033 microfarad and less
450 megohms
Greater than 0.033 microfarad
15 megohm-microfarads 1/
1/ Product obtained by multiplying the capacitance in microfarads by the insulation resistance in megohms.
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